Inventor · disambiguated record
Li He
Also filed as: HE LI · HE LI-MING
10 granted patents·1 pending application·60 citations·filing 2002–2020
88Inventor score
Top patents by PatentIndex Score
11 records- 0190US10482590B2Method and system for defect classificationKLA TENCOR CORP·Filed 2017·Granted Nov 19, 2019·11 cites·15 claims
- 0288US11580375B2Accelerated training of a machine learning based model for semiconductor applicationsKLA TENCOR CORP·Filed 2016·Granted Feb 14, 2023·9 cites·37 claims
- 0388US10607119B2Unified neural network for defect detection and classificationKLA TENCOR CORP·Filed 2017·Granted Mar 31, 2020·8 cites·26 claims
- 0487US10789703B2Semi-supervised anomaly detection in scanning electron microscope imagesKLA TENCOR CORP·Filed 2018·Granted Sep 29, 2020·9 cites·20 claims
- 0584US10436720B2Adaptive automatic defect classificationKLA TENCOR CORP·Filed 2016·Granted Oct 8, 2019·8 cites·24 claims
- 0682US9898811B2Method and system for defect classificationKLA TENCOR CORP·Filed 2015·Granted Feb 20, 2018·4 cites·13 claims
- 0781US11508109B2Methods and apparatus for machine learning renderingQUALCOMM INC·Filed 2020·Granted Nov 22, 2022·2 cites·30 claims
- 0881US9922269B2Method and system for iterative defect classificationKLA TENCOR CORP·Filed 2016·Granted Mar 20, 2018·4 cites·16 claims
- 0970US11170255B2Training a machine learning model with synthetic imagesKLA TENCOR CORP·Filed 2019·Granted Nov 9, 2021·2 cites·22 claims
- 1061US6943358B1Method for developing a calibration algorithm for quantifying the hydrocarbon content of aqueous mediaUS NAVY·Filed 2002·Granted Sep 13, 2005·3 cites·4 claims
- 1151US2022101114A1Interpretable deep learning-based defect detection and classificationKLA CORP·Filed 2020·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →