Inventor · disambiguated record
Hidetoshi Nakanishi
Also filed as: NAKANISHI HIDETOSHI
27 granted patents·221 citations·filing 1989–2017
96Inventor score
Files withDAINIPPON SCREEN MFG7SCREEN HOLDINGS CO LTD7TOSHIBA KK7NAKANISHI HIDETOSHI4MITSUBISHI ELECTRIC CORP1
Top patents by PatentIndex Score
27 records- 0192US9759656B2Inspection apparatus and inspection methodSCREEN HOLDINGS CO LTD·Filed 2017·Granted Sep 12, 2017·17 cites·8 claims
- 0290US7449726B2Power semiconductor apparatusMITSUBISHI ELECTRIC CORP·Filed 2006·Granted Nov 11, 2008·33 cites·9 claims
- 0389US9404874B2Inspection apparatus and inspection methodSCREEN HOLDINGS CO LTD·Filed 2015·Granted Aug 2, 2016·4 cites·12 claims
- 0487US9234934B2Inspecting device and inspecting methodDAINIPPON SCREEN MFG·Filed 2013·Granted Jan 12, 2016·7 cites·5 claims
- 0585US9541508B2Inspecting device and inspecting methodDAINIPPON SCREEN MFG·Filed 2014·Granted Jan 10, 2017·5 cites·7 claims
- 0682US9383321B2Inspection apparatus and inspection methodDAINIPPON SCREEN MFG·Filed 2014·Granted Jul 5, 2016·4 cites·5 claims
- 0782US8872114B2Inspection apparatus and inspection methodNAKANISHI HIDETOSHI·Filed 2012·Granted Oct 28, 2014·5 cites·17 claims
- 0881US9766132B2Measuring apparatus and measuring methodSCREEN HOLDINGS CO LTD·Filed 2016·Granted Sep 19, 2017·2 cites·6 claims
- 0976US9151669B2Inspecting device and inspecting methodDAINIPPON SCREEN MFG·Filed 2014·Granted Oct 6, 2015·3 cites·5 claims
- 1076US9103870B2Inspection apparatus and inspection methodSCREEN HOLDINGS CO LTD·Filed 2013·Granted Aug 11, 2015·3 cites·13 claims
- 1174US9651607B2Photo device inspection apparatus and photo device inspection methodDAINIPPON SCREEN MFG·Filed 2014·Granted May 16, 2017·2 cites·4 claims
- 1273US5539232AMOS composite type semiconductor deviceTOSHIBA KK·Filed 1995·Granted Jul 23, 1996·46 cites·14 claims
- 1368US9450536B2Inspection apparatus and inspection methodSCREEN HOLDINGS CO LTD·Filed 2015·Granted Sep 20, 2016·1 cites·7 claims
- 1466US8455997B2High power semiconductor deviceNAKANISHI HIDETOSHI·Filed 2011·Granted Jun 4, 2013·2 cites·3 claims
- 1565US5978800AMethod of searching data for a given character stringDAINIPPON SCREEN MFG·Filed 1998·Granted Nov 2, 1999·33 cites·8 claims
- 1662US10158325B2Inspection apparatus and inspection methodSCREEN HOLDINGS CO LTD·Filed 2014·Granted Dec 18, 2018·1 cites·6 claims
- 1762US8941824B2Semiconductor inspection method and semiconductor inspection apparatusNAKANISHI HIDETOSHI·Filed 2012·Granted Jan 27, 2015·1 cites·6 claims
- 1852US5040259AFire hose washing apparatusSHOWA INDUSTRIES CORP·Filed 1989·Granted Aug 20, 1991·20 cites·13 claims
- 1951US8530868B2Electromagnetic radiation generating element, electromagnetic radiation generating device, and method of generating electromagnetic radiationNAKANISHI HIDETOSHI·Filed 2012·Granted Sep 10, 2013·0 cites·12 claims
- 2045US6441406B1Semiconductor deviceTOSHIBA KK·Filed 2001·Granted Aug 27, 2002·4 cites·16 claims
- 2142US5796124AMOS gate controlled thyristorTOSHIBA KK·Filed 1996·Granted Aug 18, 1998·7 cites·4 claims
- 2242US5336907AMOS gate controlled thyristor having improved turn on/turn off characteristicsTOSHIBA KK·Filed 1992·Granted Aug 9, 1994·9 cites·12 claims
- 2340US10001441B2Modification processing device, modification monitoring device and modification processing methodSCREEN HOLDINGS CO LTD·Filed 2015·Granted Jun 19, 2018·0 cites·7 claims
- 2440US7091554B2Semiconductor deviceTOSHIBA KK·Filed 2003·Granted Aug 15, 2006·1 cites·11 claims
- 2536US5243667ASystem and method of image processingDAINIPPON SCREEN MFG·Filed 1992·Granted Sep 7, 1993·7 cites·20 claims
- 2631US5543639AMOS gate controlled thyristorTOSHIBA KK·Filed 1993·Granted Aug 6, 1996·2 cites·34 claims
- 2731US5489789ASemiconductor deviceTOSHIBA KK·Filed 1995·Granted Feb 6, 1996·2 cites·16 claims
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