Inventor · disambiguated record
Dave Bakker
Also filed as: BAKKER DAVE
2 granted patents·1 pending application·41 citations·filing 2007–2014
62Inventor score
Technology areasG01N
Top patents by PatentIndex Score
3 records- 0192US8045145B1Systems and methods for acquiring information about a defect on a specimenKLA TENCOR TECH CORP·Filed 2007·Granted Oct 25, 2011·37 cites·31 claims
- 0276US8765496B2Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysisNASSER-GHODSI MEHRAN·Filed 2008·Granted Jul 1, 2014·4 cites·21 claims
- 0360US2014291516A1Methods and Systems for Measuring a Characteristic of a Substrate or Preparing a Substrate for AnalysisKLA TENCOR TECH CORP·Filed 2014·Application pending·0 cites
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