Inventor · disambiguated record
Satoru Arakawa
Also filed as: ARAKAWA SATORU
8 granted patents·3 pending applications·65 citations·filing 1997–2023
82Inventor score
Files withMASUMURA HISASHI3SHINETSU HANDOTAI KK3ANRITSU CORP1ENVISION AESC JAPAN LTD1FUJIKOSHI KIKAI KOGYO KK1
Top patents by PatentIndex Score
11 records- 0177US8092281B2Polishing head and polishing apparatusMASUMURA HISASHI·Filed 2007·Granted Jan 10, 2012·6 cites·16 claims
- 0276US5908347APolishing system for polishing waferFUJIKOSHI KIKAI KOGYO KK·Filed 1997·Granted Jun 1, 1999·50 cites·11 claims
- 0370US9278425B2Polishing head and polishing apparatusHASHIMOTO HIROMASA·Filed 2011·Granted Mar 8, 2016·4 cites·18 claims
- 0461US8021210B2Polishing head and polishing apparatus having the sameSHINETSU HANDOTAI KK·Filed 2008·Granted Sep 20, 2011·2 cites·20 claims
- 0559US2023387546A1Battery module, and method of manufacturing battery moduleENVISION AESC JAPAN LTD·Filed 2023·Application pending·0 cites
- 0657US8323075B2Polishing head, polishing apparatus and method for demounting workpieceMASUMURA HISASHI·Filed 2007·Granted Dec 4, 2012·2 cites·16 claims
- 0754US8355467B2Amplitude probability distribution measurement apparatusANRITSU CORP·Filed 2010·Granted Jan 15, 2013·1 cites·3 claims
- 0847US8636561B2Polishing head and polishing apparatusMASUMURA HISASHI·Filed 2009·Granted Jan 28, 2014·0 cites·10 claims
- 0947US2011070813A1Method for manufacturing polishing head and polishing apparatusSHINETSU HANDOTAI KK·Filed 2009·Application pending·0 cites
- 1045US2010210192A1Polishing head and polishing apparatusSHINETSU HANDOTAI KK·Filed 2007·Application pending·0 cites
- 1134US8886486B2Device and method for testing APD measuring deviceRONTE SUNAO·Filed 2011·Granted Nov 11, 2014·0 cites·15 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →