Inventor
DENNISON CHARLES H
US254 patents
⚠️ This page may combine multiple inventors who share the name “DENNISON CHARLES H”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
37 patentsUS6924190B2Aug 2, 2005
Use of gate electrode workfunction to improve DRAM refresh
MICRON TECHNOLOGY INC110 citations99
US6037218AMar 14, 2000
Semiconductor processing methods of forming stacked capacitors
MICRON TECHNOLOGY INC120 citations99
US5858877AJan 12, 1999
Self-aligned process for making contacts to silicon substrates during the manufacture of integrated circuits therein
MICRON TECHNOLOGY INC111 citations99
US5821140AOct 13, 1998
Method of forming a bit line over capacitor array of memory cells and an array of bit line over capacitor array of memory cells
MICRON TECHNOLOGY INC115 citations99
US5686747ANov 11, 1997
Integrated circuits comprising interconnecting plugs
MICRON TECHNOLOGY INC124 citations99
US5652164AJul 29, 1997
Semiconductor processing methods of forming stacked capacitors
MICRON TECHNOLOGY INC120 citations99
US5616934AApr 1, 1997
Fully planarized thin film transistor (TFT) and process to fabricate same
MICRON TECHNOLOGY INC147 citations99
US5498562AMar 12, 1996
Semiconductor processing methods of forming stacked capacitors
MICRON TECHNOLOGY INC263 citations99
US5401681AMar 28, 1995
Method of forming a bit line over capacitor array of memory cells
MICRON TECHNOLOGY INC265 citations99
US5362666ANov 8, 1994
Method of producing a self-aligned contact penetrating cell plate
MICRON TECHNOLOGY INC204 citations99
US5330879AJul 19, 1994
Method for fabrication of close-tolerance lines and sharp emission tips on a semiconductor wafer
MICRON TECHNOLOGY INC263 citations99
US5292677AMar 8, 1994
Reduced mask CMOS process for fabricating stacked capacitor multi-megabit dynamic random access memories utilizing single etch stop layer for contacts
MICRON TECHNOLOGY INC317 citations99
US5270241ADec 14, 1993
Optimized container stacked capacitor DRAM cell utilizing sacrificial oxide deposition and chemical mechanical polishing
MICRON TECHNOLOGY INC237 citations99
US5162248ANov 10, 1992
Optimized container stacked capacitor DRAM cell utilizing sacrificial oxide deposition and chemical mechanical polishing
MICRON TECHNOLOGY INC236 citations99
US5013680AMay 7, 1991
Process for fabricating a DRAM array having feature widths that transcend the resolution limit of available photolithography
MICRON TECHNOLOGY INC461 citations99
US6552401B1Apr 22, 2003
Use of gate electrode workfunction to improve DRAM refresh
MICRON TECHNOLOGY INC85 citations98
US5563089AOct 8, 1996
Method of forming a bit line over capacitor array of memory cells and an array of bit line over capacitor array of memory cells
MICRON TECHNOLOGY INC108 citations98
US5489546AFeb 6, 1996
Method of forming CMOS devices using independent thickness spacers in a split-polysilicon DRAM process
MICRON TECHNOLOGY INC114 citations98
US5272367ADec 21, 1993
Fabrication of complementary n-channel and p-channel circuits (ICs) useful in the manufacture of dynamic random access memories (drams)
MICRON TECHNOLOGY INC141 citations98
US5229326AJul 20, 1993
Method for making electrical contact with an active area through sub-micron contact openings and a semiconductor device
MICRON TECHNOLOGY INC114 citations98
US5053351AOct 1, 1991
Method of making stacked E-cell capacitor DRAM cell
MICRON TECHNOLOGY INC150 citations98
US5651855AJul 29, 1997
Method of making self aligned contacts to silicon substrates during the manufacture of integrated circuits
MICRON TECHNOLOGY INC75 citations97
US5534449AJul 9, 1996
Methods of forming complementary metal oxide semiconductor (CMOS) integrated circuitry
MICRON TECHNOLOGY INC100 citations97
US5061650AOct 29, 1991
Method for formation of a stacked capacitor
MICRON TECHNOLOGY INC142 citations97
US6537891B1Mar 25, 2003
Silicon on insulator DRAM process utilizing both fully and partially depleted devices
MICRON TECHNOLOGY INC50 citations96
US6501114B2Dec 31, 2002
Structures comprising transistor gates
MICRON TECHNOLOGY INC45 citations96
US6420250B1Jul 16, 2002
Methods of forming portions of transistor structures, methods of forming array peripheral circuitry, and structures comprising transistor gates
MICRON TECHNOLOGY INC50 citations96
US6233190B1May 15, 2001
Method of storing a temperature threshold in an integrated circuit, method of modifying operation of dynamic random access memory in response to temperature, programmable temperature sensing circuit and memory integrated circuit
MICRON TECHNOLOGY INC57 citations96
US6221779B1Apr 24, 2001
Self-aligned process for making contacts to silicon substrates during the manufacture of integrated circuits therein
MICRON TECHNOLOGY INC24 citations96
US6083831AJul 4, 2000
Semiconductor processing method of forming a contact pedestal, of forming a storage node of a capacitor
MICRON TECHNOLOGY INC51 citations96
US5786249AJul 28, 1998
Method of forming dram circuitry on a semiconductor substrate
MICRON TECHNOLOGY INC55 citations96
US5776806AJul 7, 1998
Method of forming CMOS integrated circuitry having halo regions
MICRON TECHNOLOGY INC30 citations96
US5747855AMay 5, 1998
CMOS integrated circuitry with Halo and LDD regions
MICRON TECHNOLOGY INC38 citations96
US5663090ASep 2, 1997
Method to thermally form hemispherical grain (HSG) silicon to enhance capacitance for application in high density DRAMs
MICRON TECHNOLOGY INC53 citations96
US5397908AMar 14, 1995
Arrays of memory integrated circuitry
MICRON TECHNOLOGY INC54 citations96
US5391511AFeb 21, 1995
Semiconductor processing method of producing an isolated polysilicon lined cavity and a method of forming a capacitor
MICRON TECHNOLOGY INC83 citations96
US5198384AMar 30, 1993
Process for manufacturing a ferroelectric dynamic/non-volatile memory array using a disposable layer above storage-node junction
MICRON TECHNOLOGY INC92 citations96
MICRON SEMICONDUCTOR INC
6 patentsUS5340763AAug 23, 1994
Multi-pin stacked capacitor utilizing micro villus patterning in a container cell and method to fabricate same
MICRON SEMICONDUCTOR INC249 citations99
US5340765AAug 23, 1994
Method for forming enhanced capacitance stacked capacitor structures using hemi-spherical grain polysilicon
MICRON SEMICONDUCTOR INC252 citations99
US5338700AAug 16, 1994
Method of forming a bit line over capacitor array of memory cells
MICRON SEMICONDUCTOR INC311 citations99
US5494841AFeb 27, 1996
Split-polysilicon CMOS process for multi-megabit dynamic memories incorporating stacked container capacitor cells
MICRON SEMICONDUCTOR INC111 citations98
US5334862AAug 2, 1994
Thin film transistor (TFT) loads formed in recessed plugs
MICRON SEMICONDUCTOR INC79 citations96
US5244837ASep 14, 1993
Semiconductor electrical interconnection methods
MICRON SEMICONDUCTOR INC82 citations96
OVONYX INC
4 patentsUS6673700B2Jan 6, 2004
Reduced area intersection between electrode and programming element
OVONYX INC648 citations99
US6511867B2Jan 28, 2003
Utilizing atomic layer deposition for programmable device
OVONYX INC692 citations99
US7838341B2Nov 23, 2010
Self-aligned memory cells and method for forming
OVONYX INC52 citations98
US7314776B2Jan 1, 2008
Method to manufacture a phase change memory
OVONYX INC69 citations97
INTEL CORP
2 patentsMICRON TECHNOLOGIES INC
1 patentShowing the top 50 of 254 patents by PatentIndex Score.