P

Inventor

GUHA BISWAJEET

US108 patents
⚠️ This page may combine multiple inventors who share the name “GUHA BISWAJEET”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

43 patents
US11855223B2Dec 26, 2023

Self-aligned gate endcap (SAGE) architectures with gate-all-around devices

INTEL CORP6 citations86
US11522048B2Dec 6, 2022

Gate-all-around integrated circuit structures having source or drain structures with epitaxial nubs

INTEL CORP6 citations86
US11367796B2Jun 21, 2022

Gate-all-around integrated circuit structures having asymmetric source and drain contact structures

INTEL CORP6 citations86
US11233152B2Jan 25, 2022

Self-aligned gate endcap (SAGE) architectures with gate-all-around devices

INTEL CORP6 citations86
US11342411B2May 24, 2022

Cavity spacer for nanowire transistors

INTEL CORP7 citations84
US12342612B2Jun 24, 2025

Neighboring gate-all-around integrated circuit structures having disjoined epitaxial source or drain regions

INTEL CORP2 citations75
US12272737B2Apr 8, 2025

Gate-all-around integrated circuit structures having adjacent structures for sub-fin electrical contact

INTEL CORP2 citations75
US11799009B2Oct 24, 2023

Gate-all-around integrated circuit structures having adjacent structures for sub-fin electrical contact

INTEL CORP4 citations75
US12002810B2Jun 4, 2024

Gate-all-around integrated circuit structures having depopulated channel structures using bottom-up approach

INTEL CORP5 citations74
US11527612B2Dec 13, 2022

Gate-all-around integrated circuit structures having vertically discrete source or drain structures

INTEL CORP6 citations74
US11908856B2Feb 20, 2024

Gate-all-around integrated circuit structures having devices with source/drain-to-substrate electrical contact

INTEL CORP5 citations73
US11862635B2Jan 2, 2024

Neighboring gate-all-around integrated circuit structures having disjoined epitaxial source or drain regions

INTEL CORP2 citations73
US11824116B2Nov 21, 2023

Gate-all-around integrated circuit structures having devices with channel-to-substrate electrical contact

INTEL CORP4 citations73
US11824107B2Nov 21, 2023

Wrap-around contact structures for semiconductor nanowires and nanoribbons

INTEL CORP2 citations73
US11799037B2Oct 24, 2023

Gate-all-around integrated circuit structures having asymmetric source and drain contact structures

INTEL CORP2 citations73
US11527640B2Dec 13, 2022

Wrap-around contact structures for semiconductor nanowires and nanoribbons

INTEL CORP3 citations73
US11450738B2Sep 20, 2022

Source/drain regions in integrated circuit structures

INTEL CORP3 citations73
US11430868B2Aug 30, 2022

Buried etch-stop layer to help control transistor source/drain depth

INTEL CORP2 citations73
US11398474B2Jul 26, 2022

Neighboring gate-all-around integrated circuit structures having disjoined epitaxial source or drain regions

INTEL CORP4 citations73
US11302790B2Apr 12, 2022

Fin shaping using templates and integrated circuit structures resulting therefrom

INTEL CORP3 citations73
US11251302B2Feb 15, 2022

Epitaxial oxide plug for strained transistors

INTEL CORP2 citations73
US11205715B2Dec 21, 2021

Self-aligned nanowire

INTEL CORP2 citations73
US11929396B2Mar 12, 2024

Cavity spacer for nanowire transistors

INTEL CORP2 citations72
US11404578B2Aug 2, 2022

Dielectric isolation layer between a nanowire transistor and a substrate

INTEL CORP3 citations72
US11869891B2Jan 9, 2024

Non-planar integrated circuit structures having mitigated source or drain etch from replacement gate process

INTEL CORP2 citations71
US11804523B2Oct 31, 2023

High aspect ratio source or drain structures with abrupt dopant profile

INTEL CORP3 citations71
US11043492B2Jun 22, 2021

Self-aligned gate edge trigate and finFET devices

INTEL CORP4 citations71
US11621354B2Apr 4, 2023

Integrated circuit structures having partitioned source or drain contact structures

INTEL CORP2 citations70
US12364002B2Jul 15, 2025

Integrated circuit structures having metal gates with tapered plugs

INTEL CORP2 citations69
US12328920B2Jun 10, 2025

Nanoribbon sub-fin isolation by backside Si substrate removal etch selective to source and drain epitaxy

INTEL CORP0 citations63
US12230721B2Feb 18, 2025

Gate-all-around integrated circuit structures having asymmetric source and drain contact structures

INTEL CORP0 citations63
US12211925B2Jan 28, 2025

Gate-all-around integrated circuit structures having oxide sub-fins

INTEL CORP0 citations63
US12014959B2Jun 18, 2024

Integrated nanowire and nanoribbon patterning in transistor manufacture

INTEL CORP0 citations63
US11749733B2Sep 5, 2023

FIN shaping using templates and integrated circuit structures resulting therefrom

INTEL CORP0 citations63
US11742410B2Aug 29, 2023

Gate-all-around integrated circuit structures having oxide sub-fins

INTEL CORP0 citations63
US11715775B2Aug 1, 2023

Self-aligned gate endcap (SAGE) architectures with gate-all-around devices having epitaxial source or drain structures

INTEL CORP0 citations63
US11705518B2Jul 18, 2023

Isolation schemes for gate-all-around transistor devices

INTEL CORP0 citations63
US11588052B2Feb 21, 2023

Sub-Fin isolation schemes for gate-all-around transistor devices

INTEL CORP1 citations63
US11355608B2Jun 7, 2022

Self-aligned gate endcap (SAGE) architectures with gate-all-around devices having epitaxial source or drain structures

INTEL CORP0 citations63
US11335807B2May 17, 2022

Isolation schemes for gate-all-around transistor devices

INTEL CORP0 citations63
US11164790B2Nov 2, 2021

Integrated nanowire and nanoribbon patterning in transistor manufacture

INTEL CORP0 citations63
US12426316B2Sep 23, 2025

Method of fabricating integrated circuits with fin trim plug structures having an oxidation catalyst layer surrounded by a recessed dielectric material

INTEL CORP0 citations62
US12419091B2Sep 16, 2025

Source electrode and drain electrode protection for nanowire transistors

INTEL CORP0 citations62

KEPLER COMPUTING INC

4 patents

UNIV CORNELL

2 patents

LIPSON MICHAL

1 patent

Showing the top 50 of 108 patents by PatentIndex Score.