Inventor
LIU YAUH-CHING
US65 patents
⚠️ This page may combine multiple inventors who share the name “LIU YAUH-CHING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
30 patentsUS5013680AMay 7, 1991
Process for fabricating a DRAM array having feature widths that transcend the resolution limit of available photolithography
MICRON TECHNOLOGY INC461 citations99
US5053351AOct 1, 1991
Method of making stacked E-cell capacitor DRAM cell
MICRON TECHNOLOGY INC150 citations98
US5061650AOct 29, 1991
Method for formation of a stacked capacitor
MICRON TECHNOLOGY INC142 citations97
US5973344AOct 26, 1999
EEPROM transistor for a DRAM
MICRON TECHNOLOGY INC44 citations96
US5905280AMay 18, 1999
Capacitor structures, DRAM cell structures, methods of forming capacitors, methods of forming DRAM cells, and integrated circuits incorporating capacitor structures and DRAM cell structures
MICRON TECHNOLOGY INC38 citations96
US5723375AMar 3, 1998
Method of making EEPROM transistor for a DRAM
MICRON TECHNOLOGY INC36 citations96
US5688700ANov 18, 1997
Method of forming a field effect transistor
MICRON TECHNOLOGY INC54 citations96
US5236860AAug 17, 1993
Lateral extension stacked capacitor
MICRON TECHNOLOGY INC107 citations96
US5170233ADec 8, 1992
Method for increasing capacitive surface area of a conductive material in semiconductor processing and stacked memory cell capacitor
MICRON TECHNOLOGY INC94 citations96
US5122476AJun 16, 1992
Double DRAM cell
MICRON TECHNOLOGY INC106 citations96
US5084406AJan 28, 1992
Method for forming low resistance DRAM digit-line
MICRON TECHNOLOGY INC56 citations96
US5082797AJan 21, 1992
Method of making stacked textured container capacitor
MICRON TECHNOLOGY INC99 citations96
US5057888AOct 15, 1991
Double DRAM cell
MICRON TECHNOLOGY INC56 citations96
US4981810AJan 1, 1991
Process for creating field effect transistors having reduced-slope, staircase-profile sidewall spacers
MICRON TECHNOLOGY INC58 citations96
US5049517ASep 17, 1991
Method for formation of a stacked capacitor
MICRON TECHNOLOGY INC85 citations95
US5084405AJan 28, 1992
Process to fabricate a double ring stacked cell structure
MICRON TECHNOLOGY INC79 citations94
US6924522B2Aug 2, 2005
EEPROM transistor for a DRAM
MICRON TECHNOLOGY INC13 citations93
US6391755B2May 21, 2002
Method of making EEPROM transistor for a DRAM
MICRON TECHNOLOGY INC28 citations93
US6175129B1Jan 16, 2001
Capacitor structures, DRAM cell structures, methods of forming capacitors, methods of forming DRAM cells, and integrated circuits incorporating capacitor structures and DRAM cell structures
MICRON TECHNOLOGY INC31 citations93
US5262343ANov 16, 1993
DRAM stacked capacitor fabrication process
MICRON TECHNOLOGY INC54 citations93
US5196364AMar 23, 1993
Method of making a stacked capacitor dram cell
MICRON TECHNOLOGY INC22 citations93
US5155057AOct 13, 1992
Stacked v-cell capacitor using a disposable composite dielectric on top of a digit line
MICRON TECHNOLOGY INC23 citations93
US5139974AAug 18, 1992
Semiconductor manufacturing process for decreasing the optical refelctivity of a metal layer
MICRON TECHNOLOGY INC36 citations93
US5108943AApr 28, 1992
Mushroom double stacked capacitor
MICRON TECHNOLOGY INC28 citations93
US5100825AMar 31, 1992
Method of making stacked surrounding reintrant wall capacitor
MICRON TECHNOLOGY INC35 citations93
US5081559AJan 14, 1992
Enclosed ferroelectric stacked capacitor
MICRON TECHNOLOGY INC43 citations93
US5371701ADec 6, 1994
Stacked delta cell capacitor
MICRON TECHNOLOGY INC43 citations92
US7485961B2Feb 3, 2009
Approach to avoid buckling in BPSG by using an intermediate barrier layer
MICRON TECHNOLOGY INC12 citations84
US6690044B1Feb 10, 2004
Approach to avoid buckling BPSG by using an intermediate barrier layer
MICRON TECHNOLOGY INC15 citations84
US5321648AJun 14, 1994
Stacked V-cell capacitor using a disposable outer digit line spacer
MICRON TECHNOLOGY INC17 citations82
LSI LOGIC CORP
19 patentsUS6090239AJul 18, 2000
Method of single step damascene process for deposition and global planarization
LSI LOGIC CORP144 citations99
US6004880ADec 21, 1999
Method of single step damascene process for deposition and global planarization
LSI LOGIC CORP224 citations99
US6365452B1Apr 2, 2002
DRAM cell having a vertical transistor and a capacitor formed on the sidewalls of a trench isolation
LSI LOGIC CORP59 citations96
US6166403ADec 26, 2000
Integrated circuit having embedded memory with electromagnetic shield
LSI LOGIC CORP72 citations96
US6090661AJul 18, 2000
Formation of novel DRAM cell capacitors by integration of capacitors with isolation trench sidewalls
LSI LOGIC CORP73 citations96
US6794698B1Sep 21, 2004
Formation of novel DRAM cell capacitors by integration of capacitors with isolation trench sidewalls
LSI LOGIC CORP18 citations92
US6566171B1May 20, 2003
Fuse construction for integrated circuit structure having low dielectric constant dielectric material
LSI LOGIC CORP30 citations92
US6495426B1Dec 17, 2002
Method for simultaneous formation of integrated capacitor and fuse
LSI LOGIC CORP16 citations92
US6259146B1Jul 10, 2001
Self-aligned fuse structure and method with heat sink
LSI LOGIC CORP26 citations92
US6218276B1Apr 17, 2001
Silicide encapsulation of polysilicon gate and interconnect
LSI LOGIC CORP28 citations92
US6177699B1Jan 23, 2001
DRAM cell having a verticle transistor and a capacitor formed on the sidewalls of a trench isolation
LSI LOGIC CORP42 citations92
US6061264AMay 9, 2000
Self-aligned fuse structure and method with anti-reflective coating
LSI LOGIC CORP18 citations92
US5953614ASep 14, 1999
Process for forming self-aligned metal silicide contacts for MOS structure using single silicide-forming step
LSI LOGIC CORP48 citations92
US6566730B1May 20, 2003
Laser-breakable fuse link with alignment and break point promotion structures
LSI LOGIC CORP15 citations90
US6472715B1Oct 29, 2002
Reduced soft error rate (SER) construction for integrated circuit structures
LSI LOGIC CORP34 citations90
US6806551B2Oct 19, 2004
Fuse construction for integrated circuit structure having low dielectric constant dielectric material
LSI LOGIC CORP15 citations84
US6413848B1Jul 2, 2002
Self-aligned fuse structure and method with dual-thickness dielectric
LSI LOGIC CORP14 citations84
US6037233AMar 14, 2000
Metal-encapsulated polysilicon gate and interconnect
LSI LOGIC CORP18 citations84
US6442061B1Aug 27, 2002
Single channel four transistor SRAM
LSI LOGIC CORP15 citations81
MICRON SEMICONDUCTOR INC
1 patentShowing the top 50 of 65 patents by PatentIndex Score.