P

Inventor

LIU YAUH-CHING

US65 patents
⚠️ This page may combine multiple inventors who share the name “LIU YAUH-CHING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

30 patents
US5013680AMay 7, 1991

Process for fabricating a DRAM array having feature widths that transcend the resolution limit of available photolithography

MICRON TECHNOLOGY INC461 citations99
US5053351AOct 1, 1991

Method of making stacked E-cell capacitor DRAM cell

MICRON TECHNOLOGY INC150 citations98
US5061650AOct 29, 1991

Method for formation of a stacked capacitor

MICRON TECHNOLOGY INC142 citations97
US5973344AOct 26, 1999

EEPROM transistor for a DRAM

MICRON TECHNOLOGY INC44 citations96
US5905280AMay 18, 1999

Capacitor structures, DRAM cell structures, methods of forming capacitors, methods of forming DRAM cells, and integrated circuits incorporating capacitor structures and DRAM cell structures

MICRON TECHNOLOGY INC38 citations96
US5723375AMar 3, 1998

Method of making EEPROM transistor for a DRAM

MICRON TECHNOLOGY INC36 citations96
US5688700ANov 18, 1997

Method of forming a field effect transistor

MICRON TECHNOLOGY INC54 citations96
US5236860AAug 17, 1993

Lateral extension stacked capacitor

MICRON TECHNOLOGY INC107 citations96
US5170233ADec 8, 1992

Method for increasing capacitive surface area of a conductive material in semiconductor processing and stacked memory cell capacitor

MICRON TECHNOLOGY INC94 citations96
US5122476AJun 16, 1992

Double DRAM cell

MICRON TECHNOLOGY INC106 citations96
US5084406AJan 28, 1992

Method for forming low resistance DRAM digit-line

MICRON TECHNOLOGY INC56 citations96
US5082797AJan 21, 1992

Method of making stacked textured container capacitor

MICRON TECHNOLOGY INC99 citations96
US5057888AOct 15, 1991

Double DRAM cell

MICRON TECHNOLOGY INC56 citations96
US4981810AJan 1, 1991

Process for creating field effect transistors having reduced-slope, staircase-profile sidewall spacers

MICRON TECHNOLOGY INC58 citations96
US5049517ASep 17, 1991

Method for formation of a stacked capacitor

MICRON TECHNOLOGY INC85 citations95
US5084405AJan 28, 1992

Process to fabricate a double ring stacked cell structure

MICRON TECHNOLOGY INC79 citations94
US6924522B2Aug 2, 2005

EEPROM transistor for a DRAM

MICRON TECHNOLOGY INC13 citations93
US6391755B2May 21, 2002

Method of making EEPROM transistor for a DRAM

MICRON TECHNOLOGY INC28 citations93
US6175129B1Jan 16, 2001

Capacitor structures, DRAM cell structures, methods of forming capacitors, methods of forming DRAM cells, and integrated circuits incorporating capacitor structures and DRAM cell structures

MICRON TECHNOLOGY INC31 citations93
US5262343ANov 16, 1993

DRAM stacked capacitor fabrication process

MICRON TECHNOLOGY INC54 citations93
US5196364AMar 23, 1993

Method of making a stacked capacitor dram cell

MICRON TECHNOLOGY INC22 citations93
US5155057AOct 13, 1992

Stacked v-cell capacitor using a disposable composite dielectric on top of a digit line

MICRON TECHNOLOGY INC23 citations93
US5139974AAug 18, 1992

Semiconductor manufacturing process for decreasing the optical refelctivity of a metal layer

MICRON TECHNOLOGY INC36 citations93
US5108943AApr 28, 1992

Mushroom double stacked capacitor

MICRON TECHNOLOGY INC28 citations93
US5100825AMar 31, 1992

Method of making stacked surrounding reintrant wall capacitor

MICRON TECHNOLOGY INC35 citations93
US5081559AJan 14, 1992

Enclosed ferroelectric stacked capacitor

MICRON TECHNOLOGY INC43 citations93
US5371701ADec 6, 1994

Stacked delta cell capacitor

MICRON TECHNOLOGY INC43 citations92
US7485961B2Feb 3, 2009

Approach to avoid buckling in BPSG by using an intermediate barrier layer

MICRON TECHNOLOGY INC12 citations84
US6690044B1Feb 10, 2004

Approach to avoid buckling BPSG by using an intermediate barrier layer

MICRON TECHNOLOGY INC15 citations84
US5321648AJun 14, 1994

Stacked V-cell capacitor using a disposable outer digit line spacer

MICRON TECHNOLOGY INC17 citations82

LSI LOGIC CORP

19 patents
US6090239AJul 18, 2000

Method of single step damascene process for deposition and global planarization

LSI LOGIC CORP144 citations99
US6004880ADec 21, 1999

Method of single step damascene process for deposition and global planarization

LSI LOGIC CORP224 citations99
US6365452B1Apr 2, 2002

DRAM cell having a vertical transistor and a capacitor formed on the sidewalls of a trench isolation

LSI LOGIC CORP59 citations96
US6166403ADec 26, 2000

Integrated circuit having embedded memory with electromagnetic shield

LSI LOGIC CORP72 citations96
US6090661AJul 18, 2000

Formation of novel DRAM cell capacitors by integration of capacitors with isolation trench sidewalls

LSI LOGIC CORP73 citations96
US6794698B1Sep 21, 2004

Formation of novel DRAM cell capacitors by integration of capacitors with isolation trench sidewalls

LSI LOGIC CORP18 citations92
US6566171B1May 20, 2003

Fuse construction for integrated circuit structure having low dielectric constant dielectric material

LSI LOGIC CORP30 citations92
US6495426B1Dec 17, 2002

Method for simultaneous formation of integrated capacitor and fuse

LSI LOGIC CORP16 citations92
US6259146B1Jul 10, 2001

Self-aligned fuse structure and method with heat sink

LSI LOGIC CORP26 citations92
US6218276B1Apr 17, 2001

Silicide encapsulation of polysilicon gate and interconnect

LSI LOGIC CORP28 citations92
US6177699B1Jan 23, 2001

DRAM cell having a verticle transistor and a capacitor formed on the sidewalls of a trench isolation

LSI LOGIC CORP42 citations92
US6061264AMay 9, 2000

Self-aligned fuse structure and method with anti-reflective coating

LSI LOGIC CORP18 citations92
US5953614ASep 14, 1999

Process for forming self-aligned metal silicide contacts for MOS structure using single silicide-forming step

LSI LOGIC CORP48 citations92
US6566730B1May 20, 2003

Laser-breakable fuse link with alignment and break point promotion structures

LSI LOGIC CORP15 citations90
US6472715B1Oct 29, 2002

Reduced soft error rate (SER) construction for integrated circuit structures

LSI LOGIC CORP34 citations90
US6806551B2Oct 19, 2004

Fuse construction for integrated circuit structure having low dielectric constant dielectric material

LSI LOGIC CORP15 citations84
US6413848B1Jul 2, 2002

Self-aligned fuse structure and method with dual-thickness dielectric

LSI LOGIC CORP14 citations84
US6037233AMar 14, 2000

Metal-encapsulated polysilicon gate and interconnect

LSI LOGIC CORP18 citations84
US6442061B1Aug 27, 2002

Single channel four transistor SRAM

LSI LOGIC CORP15 citations81

MICRON SEMICONDUCTOR INC

1 patent

Showing the top 50 of 65 patents by PatentIndex Score.