Inventor · disambiguated record
Hung Phi Nguyen
Also filed as: NGUYEN HUNG · NGUYEN HUNG P · NGUYEN HUNG PHI
48 granted patents·4 pending applications·475 citations·filing 1987–2023
98Inventor score
Top patents by PatentIndex Score
52 records- 0197US11852592B2Time domain multiplexed defect scannerLUMINA INSTR INC·Filed 2023·Granted Dec 26, 2023·8 cites·21 claims
- 0297US11733173B1Time domain multiplexed defect scannerLUMINA INSTR INC·Filed 2023·Granted Aug 22, 2023·8 cites·21 claims
- 0397US11255796B2Region prober optical inspectorLUMINA INSTR INC·Filed 2020·Granted Feb 22, 2022·10 cites·21 claims
- 0497US10767977B1Scattered radiation defect depth detectionLUMINA INSTR INC·Filed 2020·Granted Sep 8, 2020·8 cites·20 claims
- 0597US5180004AIntegral heater-evaporator coreGEN MOTORS CORP·Filed 1992·Granted Jan 19, 1993·122 cites·3 claims
- 0695US7161668B2Wafer edge inspectionKLA TENCOR TECH CORP·Filed 2005·Granted Jan 9, 2007·24 cites·16 claims
- 0794US7161667B2Wafer edge inspectionKLA TENCOR TECH CORP·Filed 2005·Granted Jan 9, 2007·22 cites·18 claims
- 0892US11536940B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2020·Granted Dec 27, 2022·2 cites·14 claims
- 0991US8848181B1Multi-surface scattered radiation differentiationMEEKS STEVEN W·Filed 2013·Granted Sep 30, 2014·10 cites·19 claims
- 1090US10094787B2Multi-surface specular reflection inspectorZETA INSTR INC·Filed 2016·Granted Oct 9, 2018·4 cites·20 claims
- 1190US9921169B2Method of detecting defect location using multi-surface specular reflectionZETA INSTR INC·Filed 2016·Granted Mar 20, 2018·4 cites·16 claims
- 1290US8836935B1Optical inspector with selective scattered radiation blockerMEEKS STEVEN W·Filed 2013·Granted Sep 16, 2014·9 cites·19 claims
- 1390US8830457B1Multi-surface optical inspectorZETA INSTR INC·Filed 2013·Granted Sep 9, 2014·9 cites·13 claims
- 1486US7532318B2Wafer edge inspectionKLA TENCOR CORP·Filed 2006·Granted May 12, 2009·10 cites·29 claims
- 1582US10048480B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesXU JAMES JIANGUO·Filed 2011·Granted Aug 14, 2018·4 cites·9 claims
- 1682US8823935B1Detecting and classifying surface defects with multiple radiation collectorsMEEKS STEVEN W·Filed 2009·Granted Sep 2, 2014·12 cites·10 claims
- 1780US12265212B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2022·Granted Apr 1, 2025·0 cites·1 claims
- 1880US10648928B1Scattered radiation optical scannerLUMINA INSTR INC·Filed 2019·Granted May 12, 2020·1 cites·20 claims
- 1978US4782862ASolenoid valveGEN MOTORS CORP·Filed 1987·Granted Nov 8, 1988·32 cites·8 claims
- 2077US8896825B2Optical inspectorMEEKS STEVEN W·Filed 2013·Granted Nov 25, 2014·4 cites·17 claims
- 2175USD522028SLinear actuatorGTO INC·Filed 2005·Granted May 30, 2006·23 cites·1 claims
- 2274US9389408B23D microscope and methods of measuring patterned substratesHOU ZHEN·Filed 2011·Granted Jul 12, 2016·4 cites·28 claims
- 2374US5046555AExtended surface tube-to-header connection for condenserGEN MOTORS CORP·Filed 1990·Granted Sep 10, 1991·38 cites·8 claims
- 2472US11294161B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2020·Granted Apr 5, 2022·0 cites·15 claims
- 2572US8325334B2Substrate edge inspectionRAMACHANDRAN MAHENDRA P·Filed 2010·Granted Dec 4, 2012·3 cites·20 claims
- 2672USD502477SLinear actuatorFiled 2002·Granted Mar 1, 2005·22 cites·1 claims
- 2765US2025093274A1Dual scan beam separation with independent angle of incidence defect scanner and optical inspectorLUMINA INSTR INC·Filed 2023·Application pending·0 cites
- 2862US12146732B2Surface contour measurementLUMINA INSTR INC·Filed 2022·Granted Nov 19, 2024·0 cites·20 claims
- 2962US10884228B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2018·Granted Jan 5, 2021·0 cites·11 claims
- 3061US12146830B2Slope, p-component and s-component measurementLUMINA INSTR INC·Filed 2022·Granted Nov 19, 2024·0 cites·21 claims
- 3161US12130243B2Angle independent optical surface inspectorLUMINA INSTRAMENTS INC·Filed 2022·Granted Oct 29, 2024·0 cites·22 claims
- 3261US8498184B1Interchangeable disk clampKUDINAR RUSMIN·Filed 2009·Granted Jul 30, 2013·2 cites·19 claims
- 3361USD522546SLinear actuatorGTO INC·Filed 2005·Granted Jun 6, 2006·13 cites·1 claims
- 3461USD522547SLinear actuatorGTO INC·Filed 2005·Granted Jun 6, 2006·13 cites·1 claims
- 3557US5058662AMulti tube heat exchanger with integral tube spacers and interlocksGEN MOTORS CORP·Filed 1990·Granted Oct 22, 1991·23 cites·9 claims
- 3656US12147033B2Scanning micro profilerLUMINA INSTR INC·Filed 2022·Granted Nov 19, 2024·0 cites·20 claims
- 3756US10641713B1Phase retardance optical scannerLUMINA INSTR INC·Filed 2019·Granted May 5, 2020·0 cites·20 claims
- 3856US6930765B2Multiple spot size optical profilometer, ellipsometer, reflectometer and scatterometerKLA TENCOR TECHNOLOGIES·Filed 2002·Granted Aug 16, 2005·5 cites·24 claims
- 3954US11988615B2Region prober optical inspectorLUMINA INSTR·Filed 2022·Granted May 21, 2024·0 cites·21 claims
- 4050US8830456B2Optical inspectorMEEKS STEVEN W·Filed 2013·Granted Sep 9, 2014·0 cites·20 claims
- 4149US10209501B23D microscope and methods of measuring patterned substratesZETA INSTR INC·Filed 2016·Granted Feb 19, 2019·0 cites·15 claims
- 4249US7557525B2Dual swing gate control systemGTO INC·Filed 2007·Granted Jul 7, 2009·2 cites·13 claims
- 4348US2007096872A1Access control system and methodGTO INC·Filed 2006·Application pending·0 cites
- 4447US2016231148A1Floating optical sensor mountPARKER HANNIFIN CORP·Filed 2016·Application pending·0 cites
- 4546US9422950B2Floating optical sensor mountHARTZELL JOHN·Filed 2012·Granted Aug 23, 2016·1 cites·12 claims
- 4645US2015026715A1In-stream video advertising using a user-choice-based ad unitVISIBLE MEASURES CORP·Filed 2013·Application pending·0 cites
- 4744US8976366B2System and method for monitoring LED chip surface roughening processXU JAMES JIANGUO·Filed 2012·Granted Mar 10, 2015·0 cites·42 claims
- 4843US6882437B2Method of detecting the thickness of thin film disks or wafersKLA TENCOR TECHNOLOGIES·Filed 2002·Granted Apr 19, 2005·2 cites·26 claims
- 4942US10769769B2Dual mode inspectorZETA INSTR INC·Filed 2016·Granted Sep 8, 2020·0 cites·22 claims
- 5040US5716322AMedical instrument and method for lubrication and sterilization thereofJOHNSON & JOHNSON MEDICAL·Filed 1996·Granted Feb 10, 1998·19 cites·16 claims
Showing the top 50 of 52 patent records by PatentIndex Score.
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