Inventor · disambiguated record
Troy Gugel
Also filed as: GUGEL TROY · GUGEL TROY V
5 granted patents·3 pending applications·33 citations·filing 2000–2012
77Inventor score
Top patents by PatentIndex Score
8 records- 0189US7271086B2Microfeature workpieces and methods of forming a redistribution layer on microfeature workpiecesMICRON TECHNOLOGY INC·Filed 2005·Granted Sep 18, 2007·18 cites·31 claims
- 0281US8163468B2Method of reducing photoresist defects during fabrication of a semiconductor deviceHISHIRO YOSHIKI·Filed 2008·Granted Apr 24, 2012·6 cites·8 claims
- 0367US8859195B2Methods of lithographically patterning a substrateHISHIRO YOSHIKI·Filed 2012·Granted Oct 14, 2014·1 cites·14 claims
- 0459US7095885B1Method for measuring registration of overlapping material layers of an integrated circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Aug 22, 2006·8 cites·36 claims
- 0551US8309297B2Methods of lithographically patterning a substrateHISHIRO YOSHIKI·Filed 2007·Granted Nov 13, 2012·0 cites·23 claims
- 0647US2007066040A1Microfeature workpieces and methods of forming a redistribution layer on microfeature workpiecesMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 0742US2006274935A1Method for measuring registration of overlapping material layers of an integrated circuitDELAROSA EUGENE A·Filed 2006·Application pending·0 cites
- 0842US2007019859A1Method for measuring registrationDELAROSA EUGENE A·Filed 2006·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →