Inventor · disambiguated record
Ashok Kulkarni
Also filed as: KULKARNI ASHOK · KULKARNI ASHOK V · KULKARNI ASHOK VENKATESH
40 granted patents·1 pending application·2,214 citations·filing 1976–2020
98Inventor score
Top patents by PatentIndex Score
41 records- 0198US10043261B2Generating simulated output for a specimenKLA TENCOR CORP·Filed 2017·Granted Aug 7, 2018·32 cites·28 claims
- 0297US7877722B2Systems and methods for creating inspection recipesKLA TENCOR CORP·Filed 2007·Granted Jan 25, 2011·80 cites·20 claims
- 0397US7676077B2Methods and systems for utilizing design data in combination with inspection dataKLA TENCOR TECH CORP·Filed 2006·Granted Mar 9, 2010·277 cites·58 claims
- 0496US9401016B2Using high resolution full die image data for inspectionKLA TENCOR CORP·Filed 2015·Granted Jul 26, 2016·15 cites·89 claims
- 0596US8041103B2Methods and systems for determining a position of inspection data in design data spaceKLA TENCOR TECH CORP·Filed 2007·Granted Oct 18, 2011·85 cites·18 claims
- 0696US7756658B2Systems and methods for detecting defects on a wafer and generating inspection results for the waferKLA TENCOR CORP·Filed 2008·Granted Jul 13, 2010·62 cites·20 claims
- 0795US10181185B2Image based specimen process controlKLA TENCOR CORP·Filed 2017·Granted Jan 15, 2019·21 cites·35 claims
- 0895US9098891B2Adaptive sampling for semiconductor inspection recipe creation, defect review, and metrologyKLA TENCOR CORP·Filed 2014·Granted Aug 4, 2015·27 cites·67 claims
- 0995US8139843B2Methods and systems for utilizing design data in combination with inspection dataKULKARNI ASHOK·Filed 2011·Granted Mar 20, 2012·55 cites·31 claims
- 1095US8126255B2Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functionsBHASKAR KRIS·Filed 2008·Granted Feb 28, 2012·174 cites·61 claims
- 1195US5991699ADetecting groups of defects in semiconductor feature spaceKLA INSTR CORP·Filed 1997·Granted Nov 23, 1999·435 cites·42 claims
- 1295US4183013ASystem for extracting shape features from an imageCOULTER ELECTRONICS·Filed 1976·Granted Jan 8, 1980·260 cites·116 claims
- 1394US9041930B1Digital pathology systemYOUNG SCOTT·Filed 2011·Granted May 26, 2015·32 cites·22 claims
- 1494US8781781B2Dynamic care areasKULKARNI ASHOK V·Filed 2011·Granted Jul 15, 2014·20 cites·16 claims
- 1593US8611639B2Semiconductor device property extraction, generation, visualization, and monitoring methodsKULKARNI ASHOK·Filed 2007·Granted Dec 17, 2013·33 cites·38 claims
- 1693US8600143B1Method and system for hierarchical tissue analysis and classificationKULKARNI ASHOK V·Filed 2011·Granted Dec 3, 2013·46 cites·25 claims
- 1793US8111900B2Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticleWU KENONG·Filed 2010·Granted Feb 7, 2012·27 cites·17 claims
- 1892US6956718B1Sandwich diamond-like carbon overcoat for use in slider designs of proximity recording headsWESTERN DIGITAL FREMONT INC·Filed 2002·Granted Oct 18, 2005·49 cites·16 claims
- 1989US7729529B2Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticleKLA TENCOR TECH CORP·Filed 2004·Granted Jun 1, 2010·39 cites·19 claims
- 2089US7440607B1Outlier substrate inspectionKLA TENCOR CORP·Filed 2004·Granted Oct 21, 2008·45 cites·20 claims
- 2188US9262821B2Inspection recipe setup from reference image variationKLA TENCOR CORP·Filed 2015·Granted Feb 16, 2016·8 cites·38 claims
- 2288US6097887ASoftware system and method for graphically building customized recipe flowchartsKLA TENCOR CORP·Filed 1997·Granted Aug 1, 2000·155 cites·2 claims
- 2387US9224660B2Tuning wafer inspection recipes using precise defect locationsKLA TENCOR CORP·Filed 2014·Granted Dec 29, 2015·7 cites·39 claims
- 2486US7711177B2Methods and systems for detecting defects on a specimen using a combination of bright field channel data and dark field channel dataKLA TENCOR TECH CORP·Filed 2006·Granted May 4, 2010·11 cites·22 claims
- 2585US9355208B2Detecting defects on a waferKLA TENCOR CORP·Filed 2014·Granted May 31, 2016·8 cites·37 claims
- 2683US10359371B2Determining one or more characteristics of a pattern of interest on a specimenKLA TENCOR CORP·Filed 2016·Granted Jul 23, 2019·4 cites·27 claims
- 2782US9965848B2Shape based groupingKLA TENCOR CORP·Filed 2016·Granted May 8, 2018·4 cites·20 claims
- 2881US9170211B2Design-based inspection using repeating structuresKULKARNI ASHOK V·Filed 2012·Granted Oct 27, 2015·5 cites·35 claims
- 2981US7142992B1Flexible hybrid defect classification for semiconductor manufacturingKLA TENCOR TECH CORP·Filed 2004·Granted Nov 28, 2006·28 cites·19 claims
- 3077US6985220B1Interactive threshold tuningKLA TENCOR TECH CORP·Filed 2003·Granted Jan 10, 2006·26 cites·19 claims
- 3174US10127651B2Defect sensitivity of semiconductor wafer inspectors using design data with wafer image dataKLA TENCOR CORP·Filed 2016·Granted Nov 13, 2018·2 cites·20 claims
- 3269US10503078B2Criticality analysis augmented process window qualification samplingKLA TENCOR CORP·Filed 2018·Granted Dec 10, 2019·1 cites·18 claims
- 3365US9767548B2Outlier detection on pattern of interest image populationsKLA TENCOR CORP·Filed 2016·Granted Sep 19, 2017·1 cites·30 claims
- 3457US11410291B2System and method for generation of wafer inspection critical areasKLA CORP·Filed 2020·Granted Aug 9, 2022·0 cites·26 claims
- 3552US6233719B1System and method for analyzing semiconductor production dataKLA TENCOR CORP·Filed 1997·Granted May 15, 2001·84 cites·24 claims
- 3649US6775819B1Software system and method for graphically building customized recipe flowchartsKLA TENCOR CORP·Filed 1999·Granted Aug 10, 2004·56 cites·16 claims
- 3746US10706522B2System and method for generation of wafer inspection critical areasKLA TENCOR CORP·Filed 2016·Granted Jul 7, 2020·0 cites·32 claims
- 3846US2010119144A1Methods and systems for utilizing design data in combination with inspection dataKLA TENCOR TECH CORP·Filed 2010·Application pending·0 cites
- 3940US10074167B2Reducing registration and design vicinity induced noise for intra-die inspectionKLA TENCOR CORP·Filed 2016·Granted Sep 11, 2018·0 cites·18 claims
- 4038US9360863B2Data perturbation for wafer inspection or metrology setup using a model of a differenceTHATTAISUNDARAM GOVIND·Filed 2011·Granted Jun 7, 2016·0 cites·39 claims
- 4136US9053390B2Automated inspection scenario generationMAHADEVAN MOHAN·Filed 2012·Granted Jun 9, 2015·0 cites·17 claims
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