Inventor · disambiguated record
Naomi Miyake
Also filed as: MIYAKE NAOMI
9 granted patents·2 pending applications·75 citations·filing 1991–2010
87Inventor score
Files withMATSUSHITA ELECTRIC INDUSTRIAL CO LTD3PANASONIC CORP3MATSUSHITA ELECTRONICS CORP2MIYAKE NAOMI1NAKATA YOSHIROU1
Top patents by PatentIndex Score
11 records- 0180US8659312B2Probe card and semiconductor wafer inspection method using the sameNAKATA YOSHIROU·Filed 2010·Granted Feb 25, 2014·6 cites·17 claims
- 0268US5448159AReference voltage generatorMATSUSHITA ELECTRONICS CORP·Filed 1994·Granted Sep 5, 1995·26 cites·16 claims
- 0357US8598902B2Probe, electronic device test apparatus, and method of producing the sameUMEMURA YOSHIHARU·Filed 2009·Granted Dec 3, 2013·3 cites·28 claims
- 0455US5523710AInitial value setting circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1995·Granted Jun 4, 1996·14 cites·7 claims
- 0554US7673205B2Semiconductor IC and testing method thereofPANASONIC CORP·Filed 2007·Granted Mar 2, 2010·2 cites·1 claims
- 0646US2009289653A1Inspection apparatus and method for semiconductor ICPANASONIC CORP·Filed 2009·Application pending·0 cites
- 0744US7589546B2Inspection apparatus and method for semiconductor ICPANASONIC CORP·Filed 2007·Granted Sep 15, 2009·0 cites·5 claims
- 0844US5282165ARandom access memory with redundancy repair circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1991·Granted Jan 25, 1994·10 cites·2 claims
- 0943US5740114ARedundant memory cell selecting circuit having fuses coupled to memory cell group address and memory cell block addressMATSUSHITA ELECTRONICS CORP·Filed 1995·Granted Apr 14, 1998·9 cites·4 claims
- 1037US2007009240A1Semiconductor test deviceMIYAKE NAOMI·Filed 2006·Application pending·0 cites
- 1136US5953264ARedundant memory cell selecting circuit having fuses coupled to memory cell group address and memory cell block addressMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Sep 14, 1999·5 cites·14 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →