Inventor · disambiguated record
Quentin Ernie Walker
Also filed as: WALKER QUENTIN · WALKER QUENTIN E · WALKER QUENTIN ERNIE
7 granted patents·5 pending applications·24 citations·filing 2004–2024
78Inventor score
Top patents by PatentIndex Score
12 records- 0191US9200950B2Pulsed plasma monitoring using optical sensor and a signal analyzer forming a mean waveformLIAN LEI·Filed 2014·Granted Dec 1, 2015·19 cites·20 claims
- 0283US12253476B2Multi-level RF pulse monitoring and RF pulsing parameter optimization at a manufacturing systemAPPLIED MATERIALS INC·Filed 2024·Granted Mar 18, 2025·0 cites·20 claims
- 0379US11874234B2Multi-level RF pulse monitoring and RF pulsing parameter optimization at a manufacturing systemAPPLIED MATERIALS INC·Filed 2023·Granted Jan 16, 2024·0 cites·20 claims
- 0474US11585764B1Multi-level RF pulse monitoring and RF pulsing parameter optimization at a manufacturing systemAPPLIED MATERIALS INC·Filed 2021·Granted Feb 21, 2023·0 cites·20 claims
- 0569US2024379469A1Endpoint detection in low open area and/or high aspect ratio etch applicationsAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0665US12046522B2Endpoint detection in low open area and/or high aspect ratio etch applicationsAPPLIED MATERIALS INC·Filed 2022·Granted Jul 23, 2024·0 cites·14 claims
- 0762US2025208597A1Endpoint detection by generating synthetic sensor dataAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 0856US8089046B2Method and apparatus for calibrating mass flow controllersDAVIS MATTHEW F·Filed 2008·Granted Jan 3, 2012·3 cites·15 claims
- 0954US7393459B2Method for automatic determination of substrates states in plasma processing chambersAPPLIED MATERIALS INC·Filed 2004·Granted Jul 1, 2008·2 cites·27 claims
- 1046US2010190098A1Infrared endpoint detection for photoresist strip processesAPPLIED MATERIALS INC·Filed 2009·Application pending·0 cites
- 1144US2010076729A1Self-diagnostic semiconductor equipmentAPPLIED MATERIALS INC·Filed 2008·Application pending·0 cites
- 1239US2007249071A1Neural Network Methods and Apparatuses for Monitoring Substrate ProcessingLIAN LEI·Filed 2006·Application pending·0 cites
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