Inventor · disambiguated record
Mengmeng Ye
Also filed as: YE MENGMENG
5 granted patents·17 citations·filing 2016–2019
73Inventor score
Top patents by PatentIndex Score
5 records- 0193US10345721B1Measurement library optimization in semiconductor metrologyKLA TENCOR CORP·Filed 2016·Granted Jul 9, 2019·11 cites·16 claims
- 0284US10502692B2Automated metrology system selectionKLA TENCOR CORP·Filed 2016·Granted Dec 10, 2019·3 cites·22 claims
- 0380US11231362B1Multi-environment polarized infrared reflectometer for semiconductor metrologyKLA CORP·Filed 2019·Granted Jan 25, 2022·1 cites·20 claims
- 0475US10732520B1Measurement library optimization in semiconductor metrologyKLA TENCOR CORP·Filed 2019·Granted Aug 4, 2020·1 cites·20 claims
- 0569US10763146B2Recipe optimization based zonal analysisKLA TENCOR CORP·Filed 2017·Granted Sep 1, 2020·1 cites·13 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →