P

Inventor

EBIHARA AKIMITSU

JP53 patents
⚠️ This page may combine multiple inventors who share the name “EBIHARA AKIMITSU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NIKON CORP

34 patents
US8027027B2Sep 27, 2011

Exposure apparatus, and device manufacturing method

NIKON CORP48 citations99
US7486385B2Feb 3, 2009

Exposure apparatus, and device manufacturing method

NIKON CORP96 citations99
US7321419B2Jan 22, 2008

Exposure apparatus, and device manufacturing method

NIKON CORP112 citations99
US6437463B1Aug 20, 2002

Wafer positioner with planar motor and mag-lev fine stage

NIKON CORP135 citations99
US6246204B1Jun 12, 2001

Electromagnetic alignment and scanning apparatus

NIKON CORP94 citations99
US6323935B1Nov 27, 2001

Electromagnetic alignment and scanning apparatus

NIKON CORP65 citations97
US6693402B2Feb 17, 2004

Electromagnetic alignment and scanning apparatus

NIKON CORP24 citations96
US6329780B1Dec 11, 2001

Electromagnetic alignment and scanning apparatus

NIKON CORP28 citations96
US6255796B1Jul 3, 2001

Electromagnetic alignment and scanning apparatus

NIKON CORP44 citations96
US6255795B1Jul 3, 2001

Electromagnetic alignment and scanning apparatus

NIKON CORP23 citations96
US6252370B1Jun 26, 2001

Electromagnetic alignment and scanning apparatus

NIKON CORP38 citations96
US5996437ADec 7, 1999

Precision motion stage with single guide beam and follower stage

NIKON CORP62 citations95
US9274437B2Mar 1, 2016

Exposure apparatus and device manufacturing method

NIKON CORP6 citations93
US8018575B2Sep 13, 2011

Exposure apparatus, and device manufacturing method

NIKON CORP11 citations93
US6391503B2May 21, 2002

Scanning exposure methods

NIKON CORP37 citations93
US6281643B1Aug 28, 2001

Stage apparatus

NIKON CORP17 citations93
US5806193ASep 15, 1998

Tilt and movement apparatus using flexure and air cylinder

NIKON CORP41 citations93
US5726542AMar 10, 1998

Stage apparatus

NIKON CORP26 citations93
US9810995B2Nov 7, 2017

Exposure apparatus and device manufacturing method

NIKON CORP3 citations84
US9551943B2Jan 24, 2017

Exposure apparatus and device manufacturing method

NIKON CORP3 citations84
US6969966B2Nov 29, 2005

Electromagnetic alignment and scanning apparatus

NIKON CORP11 citations82
US7812925B2Oct 12, 2010

Exposure apparatus, and device manufacturing method

NIKON CORP3 citations74
US7573225B2Aug 11, 2009

Electromagnetic alignment and scanning apparatus

NIKON CORP4 citations74
US7012398B2Mar 14, 2006

Electromagnetic alignment and scanning apparatus

NIKON CORP5 citations74
US6844695B2Jan 18, 2005

Electromagnetic alignment and scanning apparatus

NIKON CORP3 citations74
US10191388B2Jan 29, 2019

Exposure apparatus, and device manufacturing method

NIKON CORP1 citations73
US10007188B2Jun 26, 2018

Exposure apparatus and device manufacturing method

NIKON CORP1 citations63
US9025129B2May 5, 2015

Exposure apparatus, and device manufacturing method

NIKON CORP0 citations63
US9019473B2Apr 28, 2015

Exposure apparatus and device manufacturing method

NIKON CORP0 citations63
US9001307B2Apr 7, 2015

Exposure apparatus and device manufacturing method

NIKON CORP0 citations63
US8724085B2May 13, 2014

Exposure apparatus, and device manufacturing method

NIKON CORP0 citations63
US8717537B2May 6, 2014

Exposure apparatus, and device manufacturing method

NIKON CORP0 citations63
US8692976B2Apr 8, 2014

Exposure apparatus, and device manufacturing method

NIKON CORP0 citations63
US6844696B2Jan 18, 2005

Electromagnetic alignment and scanning apparatus

NIKON CORP1 citations63

EBIHARA AKIMITSU

10 patents

NIPPON KOGAKU KK

2 patents

MINOLTA CO LTD

2 patents

NIKON PRECISION INC

1 patent

NIKON CORP JAPAN

1 patent

Showing the top 50 of 53 patents by PatentIndex Score.