Inventor · disambiguated record

Mark Plemmons

Also filed as: PLEMMONS MARK · PLEMMONS MARK P

2 granted patents·37 citations·filing 2004–2014

62Inventor score

Technology areasG01N

Files withADE CORP1 KLA TENCOR CORP1

Top patents by PatentIndex Score

2 records

0190US9702829B1Systems and methods for wafer surface feature detection and quantificationKLA TENCOR CORP·Filed 2014·Granted Jul 11, 2017·12 cites·25 claims
0279US7280200B2Detection of a wafer edge using collimated lightADE CORP·Filed 2004·Granted Oct 9, 2007·25 cites·37 claims

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