Inventor

FUJII SYUSO

JP34 patents

⚠️ This page may combine multiple inventors who share the name “FUJII SYUSO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FUJII SYUSO

TOSHIBA KK

Semiconductor memory device having burn-in test function

Semiconductor memory device capable of directly reading the potential of bit lines

TTL to CMOS buffer circuit

Semiconductor memory device having cell array divided into a plurality of cell blocks

Semiconductor device having different impurity concentration wells

Semiconductor integrated circuit device

Semiconductor memory device

Semiconductor device having different impurity concentration wells

Semiconductor device

Semiconductor memory device

Input protection circuit for semiconductor integrated circuit device

Dynamic memory device with improved wiring layer layout

Semiconductor integrated circuit technology for eliminating circuits or arrays having abnormal operating characteristics

Semiconductor memory device having cell array divided into a plurality of cell blocks

Input protection circuit formed in a semiconductor substrate

Semiconductor device having different impurity concentration wells

Semiconductor device having different impurity concentration wells

Semiconductor memory device

Semiconductor memory device with voltage bootstrap

Semiconductor device having input protection circuit

Semiconductor memory device having cell array divided into a plurality of cell blocks

Semiconductor memory apparatus with configured word lines to reduce noise

Semiconductor device having different impurity concentration wells

Mos-type charging circuit

Reference voltage generating circuit device

Semiconductor memory having barrier transistors connected between sense and restore circuits

Semiconductor memory device with redundancy circuits

Bi-cmos semiconductor device having memory cells formed in isolated wells

Substrate structure of semi-conductor device

Dynamic memory device

Semiconductor memory device

TOKYO SHIBAURA ELECTRIC CO

Semiconductor dynamic memory device

Dynamic memory device with an RC circuit for inhibiting the effects of alpha particle radiation

KANUSHIKI KAISHA TOSHIBA

Semiconductor integrated circuit including an intrinsic MOS transistor for generating a reference voltage