Inventor
WU DAVID M
US12 patents
⚠️ This page may combine multiple inventors who share the name “WU DAVID M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
6 patentsUS6815977B2Nov 9, 2004
Scan cell systems and methods
INTEL CORP55 citations90
US6795948B2Sep 21, 2004
Weighted random pattern test using pre-stored weights
INTEL CORP17 citations83
US6683467B1Jan 27, 2004
Method and apparatus for providing rotational burn-in stress testing
INTEL CORP7 citations74
US7370249B2May 6, 2008
Method and apparatus for testing a memory array
INTEL CORP3 citations58
US7216274B2May 8, 2007
Flexible scan architecture
INTEL CORP3 citations57
US7734972B2Jun 8, 2010
Common test logic for multiple operation modes
INTEL CORP0 citations45
IBM
5 patentsUS5920489AJul 6, 1999
Method and system for modeling the behavior of a circuit
IBM56 citations94
US5581699ADec 3, 1996
System and method for testing a clock signal
IBM17 citations79
US5299136AMar 29, 1994
Fully testable DCVS circuits with single-track global wiring
IBM15 citations71
US5272397ADec 21, 1993
Basic DCVS circuits with dual function load circuits
IBM13 citations70
US5042034AAug 20, 1991
By-pass boundary scan design
IBM19 citations67