Inventor
NAGANO HAJIME
JP50 patents
⚠️ This page may combine multiple inventors who share the name “NAGANO HAJIME”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
35 patentsUS6531754B1Mar 11, 2003
Manufacturing method of partial SOI wafer, semiconductor device using the partial SOI wafer and manufacturing method thereof
TOSHIBA KK250 citations99
US6835981B2Dec 28, 2004
Semiconductor chip which combines bulk and SOI regions and separates same with plural isolation regions
TOSHIBA KK88 citations98
US6630714B2Oct 7, 2003
Semiconductor device formed in semiconductor layer arranged on substrate with one of insulating film and cavity interposed between the substrate and the semiconductor layer
TOSHIBA KK47 citations96
US7884415B2Feb 8, 2011
Semiconductor memory device having multiple air gaps in interelectrode insulating film
TOSHIBA KK33 citations93
US7323748B2Jan 29, 2008
Semiconductor device having epitaxial layer
TOSHIBA KK13 citations93
US7148543B2Dec 12, 2006
Semiconductor chip which combines bulk and SOI regions and separates same with plural isolation regions
TOSHIBA KK16 citations93
US7049661B2May 23, 2006
Semiconductor device having epitaxial layer
TOSHIBA KK28 citations93
US7018904B2Mar 28, 2006
Semiconductor chip having multiple functional blocks integrated in a single chip and method for fabricating the same
TOSHIBA KK17 citations93
US7057259B2Jun 6, 2006
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them
TOSHIBA KK35 citations92
US6906384B2Jun 14, 2005
Semiconductor device having one of patterned SOI and SON structure
TOSHIBA KK44 citations92
US6855976B2Feb 15, 2005
Semiconductor device using partial SOI substrate and manufacturing method thereof
TOSHIBA KK24 citations92
US9728552B1Aug 8, 2017
Semiconductor memory device having voids between word lines and a source line
TOSHIBA KK10 citations84
US7294562B2Nov 13, 2007
Semiconductor substrate, method of manufacturing the same, semiconductor device, and method of manufacturing the same
TOSHIBA KK12 citations84
US7095081B2Aug 22, 2006
Semiconductor device and manufacturing method thereof
TOSHIBA KK11 citations84
US7075169B2Jul 11, 2006
Semiconductor device having a hollow region and method of manufacturing the same
TOSHIBA KK12 citations84
US7525154B2Apr 28, 2009
Semiconductor substrate, manufacturing method therefor, and semiconductor device
TOSHIBA KK7 citations74
US7285825B2Oct 23, 2007
Element formation substrate for forming semiconductor device
TOSHIBA KK6 citations74
US7265017B2Sep 4, 2007
Method for manufacturing partial SOI substrates
TOSHIBA KK5 citations74
US7187035B2Mar 6, 2007
Semiconductor device comprising multiple layers with trenches formed on a semiconductor substrate
TOSHIBA KK9 citations74
US7122864B2Oct 17, 2006
Semiconductor substrate having a partial SOI structure, method of manufacturing the same, a semiconductor device having a partial SOI structure, and method of manufacturing the same
TOSHIBA KK9 citations74
US6956265B2Oct 18, 2005
Semiconductor device and method for manufacturing partial SOI substrates
TOSHIBA KK8 citations74
US7420249B2Sep 2, 2008
Semiconductor device formed in semiconductor layer arranged on substrate with one of insulating film and cavity interposed between the substrate and the semiconductor layer
TOSHIBA KK7 citations73
US7019365B2Mar 28, 2006
Semiconductor device formed in semiconductor layer arranged on substrate with one of insulating film and cavity interposed between the substrate and the semiconductor layer
TOSHIBA KK8 citations73
US6933590B2Aug 23, 2005
Semiconductor device comprising plurality of semiconductor areas having the same top surface and different film thicknesses and manufacturing method for the same
TOSHIBA KK8 citations73
US8017990B2Sep 13, 2011
Nonvolatile semiconductor memory device and method of fabricating the same
TOSHIBA KK2 citations63
US7718483B2May 18, 2010
Method of manufacturing non-volatile semiconductor memory
TOSHIBA KK4 citations63
US7510945B2Mar 31, 2009
Element formation substrate, method of manufacturing the same, and semiconductor device
TOSHIBA KK5 citations63
US7439112B2Oct 21, 2008
Semiconductor device using partial SOI substrate and manufacturing method thereof
TOSHIBA KK4 citations63
US7112822B2Sep 26, 2006
Semiconductor device using partial SOI substrate and manufacturing method thereof
TOSHIBA KK2 citations63
US7071039B2Jul 4, 2006
Manufacturing method of partial SOI wafer, semiconductor device using the partial SOI wafer and manufacturing method thereof
TOSHIBA KK3 citations63
US7763931B2Jul 27, 2010
Nonvolatile semiconductor memory device and method of manufacturing the same
TOSHIBA KK5 citations54
US7598562B2Oct 6, 2009
Semiconductor device and method of manufacturing the same
TOSHIBA KK1 citations52
US7521300B2Apr 21, 2009
Semiconductor device substrate including a single-crystalline layer and method of manufacturing semiconductor device substrate
TOSHIBA KK0 citations52
US9478416B1Oct 25, 2016
Semiconductor manufacturing apparatus and method of manufacturing semiconductor device
TOSHIBA KK0 citations47
US9558936B2Jan 31, 2017
Semiconductor manufacturing apparatus and semiconductor manufacturing method
TOSHIBA KK0 citations42
TOSHIBA MEMORY CORP
6 patentsUS10438966B2Oct 8, 2019
Semiconductor device
TOSHIBA MEMORY CORP9 citations82
US10186521B2Jan 22, 2019
Semiconductor device and method for manufacturing semiconductor device
TOSHIBA MEMORY CORP5 citations73
US9920425B2Mar 20, 2018
Semiconductor manufacturing apparatus and manufacturing method of semiconductor device
TOSHIBA MEMORY CORP3 citations73
US10036091B2Jul 31, 2018
Semiconductor manufacturing apparatus and manufacturing method of semiconductor device
TOSHIBA MEMORY CORP0 citations42
US9920427B2Mar 20, 2018
Semiconductor manufacturing apparatus and manufacturing method of semiconductor device
TOSHIBA MEMORY CORP0 citations40
US10669621B2Jun 2, 2020
Vaporization system
TOSHIBA MEMORY CORP0 citations39
MITSUBISHI HEAVY IND LTD
3 patentsUS7381389B2Jun 3, 2008
Wet gas purification method and system for practicing the same
MITSUBISHI HEAVY IND LTD12 citations84
US6770119B2Aug 3, 2004
Mercury removal method and system
MITSUBISHI HEAVY IND LTD14 citations82
US7749455B2Jul 6, 2010
Apparatus for treating COS for gas produced by gasification and method for treating COS
MITSUBISHI HEAVY IND LTD2 citations60