P

Inventor

NAGANO HAJIME

JP50 patents
⚠️ This page may combine multiple inventors who share the name “NAGANO HAJIME”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOSHIBA KK

35 patents
US6531754B1Mar 11, 2003

Manufacturing method of partial SOI wafer, semiconductor device using the partial SOI wafer and manufacturing method thereof

TOSHIBA KK250 citations99
US6835981B2Dec 28, 2004

Semiconductor chip which combines bulk and SOI regions and separates same with plural isolation regions

TOSHIBA KK88 citations98
US6630714B2Oct 7, 2003

Semiconductor device formed in semiconductor layer arranged on substrate with one of insulating film and cavity interposed between the substrate and the semiconductor layer

TOSHIBA KK47 citations96
US7884415B2Feb 8, 2011

Semiconductor memory device having multiple air gaps in interelectrode insulating film

TOSHIBA KK33 citations93
US7323748B2Jan 29, 2008

Semiconductor device having epitaxial layer

TOSHIBA KK13 citations93
US7148543B2Dec 12, 2006

Semiconductor chip which combines bulk and SOI regions and separates same with plural isolation regions

TOSHIBA KK16 citations93
US7049661B2May 23, 2006

Semiconductor device having epitaxial layer

TOSHIBA KK28 citations93
US7018904B2Mar 28, 2006

Semiconductor chip having multiple functional blocks integrated in a single chip and method for fabricating the same

TOSHIBA KK17 citations93
US7057259B2Jun 6, 2006

Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them

TOSHIBA KK35 citations92
US6906384B2Jun 14, 2005

Semiconductor device having one of patterned SOI and SON structure

TOSHIBA KK44 citations92
US6855976B2Feb 15, 2005

Semiconductor device using partial SOI substrate and manufacturing method thereof

TOSHIBA KK24 citations92
US9728552B1Aug 8, 2017

Semiconductor memory device having voids between word lines and a source line

TOSHIBA KK10 citations84
US7294562B2Nov 13, 2007

Semiconductor substrate, method of manufacturing the same, semiconductor device, and method of manufacturing the same

TOSHIBA KK12 citations84
US7095081B2Aug 22, 2006

Semiconductor device and manufacturing method thereof

TOSHIBA KK11 citations84
US7075169B2Jul 11, 2006

Semiconductor device having a hollow region and method of manufacturing the same

TOSHIBA KK12 citations84
US7525154B2Apr 28, 2009

Semiconductor substrate, manufacturing method therefor, and semiconductor device

TOSHIBA KK7 citations74
US7285825B2Oct 23, 2007

Element formation substrate for forming semiconductor device

TOSHIBA KK6 citations74
US7265017B2Sep 4, 2007

Method for manufacturing partial SOI substrates

TOSHIBA KK5 citations74
US7187035B2Mar 6, 2007

Semiconductor device comprising multiple layers with trenches formed on a semiconductor substrate

TOSHIBA KK9 citations74
US7122864B2Oct 17, 2006

Semiconductor substrate having a partial SOI structure, method of manufacturing the same, a semiconductor device having a partial SOI structure, and method of manufacturing the same

TOSHIBA KK9 citations74
US6956265B2Oct 18, 2005

Semiconductor device and method for manufacturing partial SOI substrates

TOSHIBA KK8 citations74
US7420249B2Sep 2, 2008

Semiconductor device formed in semiconductor layer arranged on substrate with one of insulating film and cavity interposed between the substrate and the semiconductor layer

TOSHIBA KK7 citations73
US7019365B2Mar 28, 2006

Semiconductor device formed in semiconductor layer arranged on substrate with one of insulating film and cavity interposed between the substrate and the semiconductor layer

TOSHIBA KK8 citations73
US6933590B2Aug 23, 2005

Semiconductor device comprising plurality of semiconductor areas having the same top surface and different film thicknesses and manufacturing method for the same

TOSHIBA KK8 citations73
US8017990B2Sep 13, 2011

Nonvolatile semiconductor memory device and method of fabricating the same

TOSHIBA KK2 citations63
US7718483B2May 18, 2010

Method of manufacturing non-volatile semiconductor memory

TOSHIBA KK4 citations63
US7510945B2Mar 31, 2009

Element formation substrate, method of manufacturing the same, and semiconductor device

TOSHIBA KK5 citations63
US7439112B2Oct 21, 2008

Semiconductor device using partial SOI substrate and manufacturing method thereof

TOSHIBA KK4 citations63
US7112822B2Sep 26, 2006

Semiconductor device using partial SOI substrate and manufacturing method thereof

TOSHIBA KK2 citations63
US7071039B2Jul 4, 2006

Manufacturing method of partial SOI wafer, semiconductor device using the partial SOI wafer and manufacturing method thereof

TOSHIBA KK3 citations63
US7763931B2Jul 27, 2010

Nonvolatile semiconductor memory device and method of manufacturing the same

TOSHIBA KK5 citations54
US7598562B2Oct 6, 2009

Semiconductor device and method of manufacturing the same

TOSHIBA KK1 citations52
US7521300B2Apr 21, 2009

Semiconductor device substrate including a single-crystalline layer and method of manufacturing semiconductor device substrate

TOSHIBA KK0 citations52
US9478416B1Oct 25, 2016

Semiconductor manufacturing apparatus and method of manufacturing semiconductor device

TOSHIBA KK0 citations47
US9558936B2Jan 31, 2017

Semiconductor manufacturing apparatus and semiconductor manufacturing method

TOSHIBA KK0 citations42

TOSHIBA MEMORY CORP

6 patents

MITSUBISHI HEAVY IND LTD

3 patents

KYOCERA CORP

2 patents

KABUSHIKIA KAISHA TOSHIBA

1 patent

NAGANO HAJIME

1 patent

RYOEN TECHNICAL SERVICE CORP

1 patent

YAZAKI CORP

1 patent