Inventor · disambiguated record
Hiromitsu Takasu
Also filed as: TAKASU HIROMITSU
3 granted patents·3 pending applications·26 citations·filing 2005–2025
67Inventor score
Top patents by PatentIndex Score
6 records- 0186US7339385B2Semiconductor test apparatus and interface plateADVANTEST CORP·Filed 2005·Granted Mar 4, 2008·19 cites·3 claims
- 0275US2025172612A1Test arrangement for over-the-air testing an angled device under test in a device-under-test socketADVANTEST CORP·Filed 2025·Application pending·0 cites
- 0375US2025172600A1Test arrangement for over-the-air testing an angled device under test that is tilted relative to a surface of a carrier structureADVANTEST CORP·Filed 2025·Application pending·0 cites
- 0475US2025172613A1Test arrangement for over-the-air testing an angled device under test using a carrier structure with an openingADVANTEST CORP·Filed 2025·Application pending·0 cites
- 0558US8860454B2Connector and semiconductor testing device including the connectorONIYAMA KYOKO·Filed 2010·Granted Oct 14, 2014·5 cites·3 claims
- 0647US8905788B2Connector and semiconductor testing device including the connectorONIYAMA KYOKO·Filed 2010·Granted Dec 9, 2014·2 cites·7 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →