Inventor
ZIERAK MICHAEL J
US42 patents
⚠️ This page may combine multiple inventors who share the name “ZIERAK MICHAEL J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
18 patentsUS7943445B2May 17, 2011
Asymmetric junction field effect transistor
IBM16 citations92
US7829945B2Nov 9, 2010
Lateral diffusion field effect transistor with asymmetric gate dielectric profile
IBM31 citations92
US10050115B2Aug 14, 2018
Tapered gate oxide in LDMOS devices
IBM11 citations84
US7977714B2Jul 12, 2011
Wrapped gate junction field effect transistor
IBM7 citations84
US7956412B2Jun 7, 2011
Lateral diffusion field effect transistor with a trench field plate
IBM14 citations84
US7825441B2Nov 2, 2010
Junction field effect transistor with a hyperabrupt junction
IBM16 citations84
US9236449B2Jan 12, 2016
High voltage laterally diffused metal oxide semiconductor
IBM3 citations73
US9059276B2Jun 16, 2015
High voltage laterally diffused metal oxide semiconductor
IBM3 citations63
US7886240B2Feb 8, 2011
Modifying layout of IC based on function of interconnect and related circuit and design structure
IBM3 citations63
US6975015B2Dec 13, 2005
Modulated trigger device
IBM5 citations63
US7473643B2Jan 6, 2009
Dendrite growth control circuit
IBM2 citations62
US7109584B2Sep 19, 2006
Dendrite growth control circuit
IBM3 citations62
US9240463B2Jan 19, 2016
High voltage laterally diffused metal oxide semiconductor
IBM0 citations52
US8796108B2Aug 5, 2014
Isolated zener diode, an integrated circuit incorporating multiple instances of the zener diode, a method of forming the zener diode and a design structure for the zener diode
IBM0 citations52
US7902606B2Mar 8, 2011
Double gate depletion mode MOSFET
IBM0 citations52
US7348251B2Mar 25, 2008
Modulated trigger device
IBM0 citations52
US9383404B2Jul 5, 2016
High resistivity substrate final resistance test structure
IBM1 citations51
US7807562B2Oct 5, 2010
Dendrite growth control circuit
IBM0 citations51
GLOBALFOUNDRIES US INC
12 patentsUS12028053B2Jul 2, 2024
Structure including resistor network for back biasing FET stack
GLOBALFOUNDRIES US INC2 citations73
US11972999B2Apr 30, 2024
Unlanded thermal dissipation pillar adjacent active contact
GLOBALFOUNDRIES US INC2 citations73
US12538501B2Jan 27, 2026
Structure providing poly-resistor under shallow trench isolation and above high resistivity polysilicon layer
GLOBALFOUNDRIES US INC0 citations62
US12538550B2Jan 27, 2026
High-electron-mobility transistor with field plate and sidewall spacers
GLOBALFOUNDRIES US INC0 citations62
US12417975B2Sep 16, 2025
Electrically programmable fuse over crystalline semiconductor materials
GLOBALFOUNDRIES US INC0 citations62
US12278178B2Apr 15, 2025
Fuse element for process-induced damage protection structure
GLOBALFOUNDRIES US INC0 citations62
US11764060B2Sep 19, 2023
Field-effect transistors with a body pedestal
GLOBALFOUNDRIES US INC0 citations62
US11664412B2May 30, 2023
Structure providing poly-resistor under shallow trench isolation and above high resistivity polysilicon layer
GLOBALFOUNDRIES US INC0 citations62
US11637173B2Apr 25, 2023
Structure including polycrystalline resistor with dopant-including polycrystalline region thereunder
GLOBALFOUNDRIES US INC0 citations62
US12416530B2Sep 16, 2025
Temperature detection using negative temperature coefficient resistor in GaN setting
GLOBALFOUNDRIES US INC0 citations61
US12154956B1Nov 26, 2024
Structure including multi-level field plate and method of forming the structure
GLOBALFOUNDRIES US INC0 citations59
US11545577B2Jan 3, 2023
Semiconductor structure with in-device high resistivity polycrystalline semiconductor element and method
GLOBALFOUNDRIES US INC0 citations52
GLOBALFOUNDRIES INC
4 patentsUS9799652B1Oct 24, 2017
Semiconductor structure with a dopant implant region having a linearly graded conductivity level and method of forming the structure
GLOBALFOUNDRIES INC3 citations73
US9768028B1Sep 19, 2017
Semiconductor structure with a dopant implant region having a linearly graded conductivity level and method of forming the structure
GLOBALFOUNDRIES INC2 citations73
US9893157B1Feb 13, 2018
Structures with contact trenches and isolation trenches
GLOBALFOUNDRIES INC4 citations71
US9595579B2Mar 14, 2017
Dual shallow trench isolation (STI) structure for field effect transistor (FET)
GLOBALFOUNDRIES INC0 citations52
ANDERSON FREDERICK G
2 patentsFEILCHENFELD NATALIE B
2 patentsBREITWISCH MATTHEW J
2 patentsUS8716759B2May 6, 2014
Method to tailor location of peak electric field directly underneath an extension spacer for enhanced programmability of a prompt-shift device
BREITWISCH MATTHEW J0 citations51
US8278197B2Oct 2, 2012
Method to tailor location of peak electric field directly underneath an extension spacer for enhanced programmability of a prompt-shift device
BREITWISCH MATTHEW J0 citations51