Inventor · disambiguated record
Akhil Garg
Also filed as: GARG AKHIL
13 granted patents·1 pending application·48 citations·filing 2006–2025
89Inventor score
Files withST MICROELECTRONICS INT NV3STERLITE TECH LTD3CADENCE DESIGN SYSTEMS INC2ST MICROELECTRONICS PVT LTD2DUBEY PRASHANT1
Top patents by PatentIndex Score
14 records- 0185US11320485B1Scan wrapper architecture for system-on-chipNXP USA INC·Filed 2020·Granted May 3, 2022·2 cites·20 claims
- 0283US8381051B2Testing of multi-clock domainsST MICROELECTRONICS INT NV·Filed 2010·Granted Feb 19, 2013·5 cites·15 claims
- 0382US8527824B2Testing of multi-clock domainsST MICROELECTRONICS INT NV·Filed 2013·Granted Sep 3, 2013·4 cites·5 claims
- 0481US10222417B1Securing access to integrated circuit scan mode and dataCADENCE DESIGN SYSTEMS INC·Filed 2016·Granted Mar 5, 2019·7 cites·17 claims
- 0580US11300741B2Leaf shaped intermittent bonded optical fibre ribbonSTERLITE TECH LTD·Filed 2020·Granted Apr 12, 2022·1 cites·10 claims
- 0680US8386864B2Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfacesST MICROELECTRONICS PVT LTD·Filed 2012·Granted Feb 26, 2013·7 cites·20 claims
- 0778US8108744B2Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfacesDUBEY PRASHANT·Filed 2007·Granted Jan 31, 2012·11 cites·20 claims
- 0876US12032217B2Cable with interstitial fillers and edge ribbonsSTERLITE TECH LTD·Filed 2020·Granted Jul 9, 2024·1 cites·6 claims
- 0971US7954017B2Multiple embedded memories and testing components for the sameST MICROELECTRONICS PVT LTD·Filed 2006·Granted May 31, 2011·8 cites·20 claims
- 1059US11953749B2Intermittently bonded ribbon with colored bondsSTERLITE TECH LTD·Filed 2020·Granted Apr 9, 2024·0 cites·18 claims
- 1151US2025298207A1Optical fibre cable with improved pneumatic feedingHFCL LTD·Filed 2025·Application pending·0 cites
- 1250US8352781B2System and method for efficient detection and restoration of data storage array defectsST MICROELECTRONICS INT NV·Filed 2009·Granted Jan 8, 2013·2 cites·20 claims
- 1346US10747922B1Test circuitry with annularly arranged compressor and decompressor elementsCADENCE DESIGN SYSTEMS INC·Filed 2018·Granted Aug 18, 2020·0 cites·13 claims
- 1445US12401349B2Single event upset hardened flip-flop and methods of operationNXP BV·Filed 2023·Granted Aug 26, 2025·0 cites·19 claims
Join the waitlist — get patent alerts
Get an alert when Akhil Garg files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →