Inventor · disambiguated record
Alper Genc
Also filed as: GENC ALPER
18 granted patents·6 pending applications·259 citations·filing 2011–2024
95Inventor score
Top patents by PatentIndex Score
24 records- 0198US9786781B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reductionPEREGRINE SEMICONDUCTOR CORP·Filed 2016·Granted Oct 10, 2017·29 cites·28 claims
- 0297US11671090B2Switch FET body current management devices and methodsPSEMI CORP·Filed 2021·Granted Jun 6, 2023·7 cites·22 claims
- 0397US11632107B1Gate resistive ladder bypass for RF FET switch stackPSEMI CORP·Filed 2021·Granted Apr 18, 2023·7 cites·16 claims
- 0497US11463087B2Methods and devices to generate gate induced drain leakage current sink or source path for switch FETsPSEMI CORP·Filed 2020·Granted Oct 4, 2022·9 cites·24 claims
- 0597US11405035B1Gate resistor bypass for RF FET switch stackPSEMI CORP·Filed 2021·Granted Aug 2, 2022·9 cites·20 claims
- 0697US11011633B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reductionPSEMI CORP·Filed 2020·Granted May 18, 2021·5 cites·30 claims
- 0797US10797172B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reductionPSEMI CORP·Filed 2018·Granted Oct 6, 2020·10 cites·25 claims
- 0897US10790390B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reductionPSEMI CORP·Filed 2019·Granted Sep 29, 2020·14 cites·30 claims
- 0997US10074746B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink—harmonic wrinkle reductionPSEMI CORP·Filed 2017·Granted Sep 11, 2018·23 cites·30 claims
- 1097US9653601B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reductionPEREGRINE SEMICONDUCTOR CORP·Filed 2015·Granted May 16, 2017·29 cites·22 claims
- 1197US9087899B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reductionPEREGRINE SEMICONDUCTOR CORP·Filed 2014·Granted Jul 21, 2015·44 cites·48 claims
- 1297US8742502B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reductionBRINDLE CHRISTOPHER N·Filed 2011·Granted Jun 3, 2014·64 cites·8 claims
- 1394US12074217B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reductionPSEMI CORP·Filed 2021·Granted Aug 27, 2024·2 cites·44 claims
- 1492US12119814B2Gate resistive ladder bypass for RF FET switch stackPSEMI CORP·Filed 2023·Granted Oct 15, 2024·1 cites·19 claims
- 1592US11923838B2Inductive drain and/or body ladders in RF switch stacksPSEMI CORP·Filed 2022·Granted Mar 5, 2024·2 cites·21 claims
- 1690US12176888B2Switch FET body current management devices and methodsPSEMI CORP·Filed 2023·Granted Dec 24, 2024·1 cites·20 claims
- 1780US2025080104A1Switch fet body current management devices and methodsPSEMI CORP·Filed 2024·Application pending·0 cites
- 1878US2024429918A1Gate resistive ladder bypass for rf fet switch stackPSEMI CORP·Filed 2024·Application pending·0 cites
- 1977US2025096796A1Inductive drain and/or body ladders in rf switch stacksPSEMI CORP·Filed 2024·Application pending·0 cites
- 2073US9461037B2Reduced generation of second harmonics of FETsPEREGRINE SEMICONDUCTOR CORP·Filed 2014·Granted Oct 4, 2016·3 cites·6 claims
- 2173US2024146301A1Gate resistor bypass for rf fet switch stackPSEMI CORP·Filed 2024·Application pending·0 cites
- 2262US2024421227A1Method and apparatus for use in improving linearity of mosfets using an accumulated charge sink-harmonic wrinkle reductionPSEMI CORP·Filed 2024·Application pending·0 cites
- 2361US12476660B2System and method to reduce unwanted receive signal leakage during switchingQUALCOMM INC·Filed 2023·Granted Nov 18, 2025·0 cites·30 claims
- 2442US2022038097A1Switch fet body current management devices and methodsPSEMI CORP·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →