Inventor · disambiguated record
Amin Samsavar
Also filed as: SAMSAVAR AMIN
17 granted patents·5 pending applications·869 citations·filing 1996–2009
96Inventor score
Top patents by PatentIndex Score
22 records- 0195US5852232AAcoustic sensor as proximity detectorKLA TENCOR CORP·Filed 1997·Granted Dec 22, 1998·180 cites·42 claims
- 0294US5955661AOptical profilometer combined with stylus probe measurement deviceKLA TENCOR CORP·Filed 1997·Granted Sep 21, 1999·125 cites·39 claims
- 0393US7012438B1Methods and systems for determining a property of an insulating filmKLA TENCOR TECH CORP·Filed 2003·Granted Mar 14, 2006·63 cites·30 claims
- 0493US5948972ADual stage instrument for scanning a specimenKLA TENCOR CORP·Filed 1996·Granted Sep 7, 1999·129 cites·75 claims
- 0592US6267005B1Dual stage instrument for scanning a specimenKLA TENCOR CORP·Filed 1998·Granted Jul 31, 2001·119 cites·13 claims
- 0690US7358748B1Methods and systems for determining a property of an insulating filmKLA TENCOR TECH CORP·Filed 2005·Granted Apr 15, 2008·14 cites·20 claims
- 0787US7719294B1Systems configured to perform a non-contact method for determining a property of a specimenKLA TENCOR TECH CORP·Filed 2006·Granted May 18, 2010·10 cites·23 claims
- 0887US7248062B1Contactless charge measurement of product wafers and control of corona generation and depositionKLA TENCOR TECH CORP·Filed 2003·Granted Jul 24, 2007·30 cites·19 claims
- 0982US5866806ASystem for locating a feature of a surfaceKLA TENCOR CORP·Filed 1996·Granted Feb 2, 1999·98 cites·35 claims
- 1079US7100430B2Dual stage instrument for scanning a specimenKLA TENCOR CORP·Filed 2004·Granted Sep 5, 2006·27 cites·15 claims
- 1179US6794886B1Tank probe for measuring surface conductanceKLA TENCOR TECH CORP·Filed 2002·Granted Sep 21, 2004·24 cites·22 claims
- 1276US6759255B2Method and system for detecting metal contamination on a semiconductor waferKLA TENCOR TECH CORP·Filed 2001·Granted Jul 6, 2004·23 cites·49 claims
- 1374US7538333B1Contactless charge measurement of product wafers and control of corona generation and depositionKLA TENCOR TECH CORP·Filed 2006·Granted May 26, 2009·3 cites·18 claims
- 1471US8853592B2Method for laser machining a sample having a crystalline structureSTRAW MARCUS·Filed 2009·Granted Oct 7, 2014·2 cites·26 claims
- 1568US6520005B2System for sensing a sampleKLA TENCOR CORP·Filed 1999·Granted Feb 18, 2003·19 cites·76 claims
- 1662US7278301B2System for sensing a sampleKLA TENCOR CORP·Filed 2006·Granted Oct 9, 2007·2 cites·2 claims
- 1745US2006207318A1System for Sensing a SampleKLA TENCOR CORP·Filed 2006·Application pending·0 cites
- 1844US6931917B2System for sensing a sampleKLA TENCOR CORP·Filed 2003·Granted Aug 23, 2005·1 cites·4 claims
- 1939US2003089162A1Dual stage instrument for scanning a specimenFiled 2002·Application pending·0 cites
- 2039US2003089163A1System for sensing a sampleFiled 2002·Application pending·0 cites
- 2137US2005262931A1System for sensing a sampleMCWAID THOMAS·Filed 2005·Application pending·0 cites
- 2233US2001047682A1Dual stage instrument for scanning a specimenFiled 2001·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Amin Samsavar files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →