Inventor · disambiguated record
Anatoly Fabrikant
Also filed as: FABRIKANT ANATOLY
30 granted patents·4 pending applications·706 citations·filing 2000–2017
97Inventor score
Top patents by PatentIndex Score
34 records- 0198US7826071B2Parametric profiling using optical spectroscopic systemsKLA TENCOR CORP·Filed 2007·Granted Nov 2, 2010·114 cites·24 claims
- 0297US7433040B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2007·Granted Oct 7, 2008·28 cites·18 claims
- 0397US7317531B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2003·Granted Jan 8, 2008·83 cites·30 claims
- 0496US7564557B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2007·Granted Jul 21, 2009·19 cites·7 claims
- 0596US7298481B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2004·Granted Nov 20, 2007·46 cites·11 claims
- 0696US7289213B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2004·Granted Oct 30, 2007·49 cites·15 claims
- 0795US7933016B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2009·Granted Apr 26, 2011·15 cites·20 claims
- 0895US7876440B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2009·Granted Jan 25, 2011·13 cites·18 claims
- 0995US7663753B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2007·Granted Feb 16, 2010·19 cites·45 claims
- 1095US7280230B2Parametric profiling using optical spectroscopic systemsKLA TENCOR TECH CORP·Filed 2002·Granted Oct 9, 2007·71 cites·32 claims
- 1194US7385699B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2004·Granted Jun 10, 2008·34 cites·33 claims
- 1294US7301634B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2004·Granted Nov 27, 2007·35 cites·33 claims
- 1394US7301649B2System for scatterometric measurements and applicationsKLA TENCOR TECH CORP·Filed 2005·Granted Nov 27, 2007·21 cites·25 claims
- 1494US7099005B1System for scatterometric measurements and applicationsKLA TENCOR TECH CORP·Filed 2000·Granted Aug 29, 2006·49 cites·125 claims
- 1594US6900892B2Parametric profiling using optical spectroscopic systemsKLA TENCOR TECH CORP·Filed 2000·Granted May 31, 2005·66 cites·92 claims
- 1684US7312881B2Parametric profiling using optical spectroscopic systems to adjust processing parameterKLA TENCOR TECH CORP·Filed 2006·Granted Dec 25, 2007·7 cites·7 claims
- 1782US8978660B2Tilt compensation, measurement, and associated adjustment of refractive prescriptions during surgical and other treatments of the eyeCHERNYAK DIMITRI·Filed 2011·Granted Mar 17, 2015·14 cites·10 claims
- 1877US9498117B2Systems and methods for treatment deconvolution using dual scale kernelsAMO DEV LLC·Filed 2014·Granted Nov 22, 2016·7 cites·20 claims
- 1977US7821654B2System for scatterometric measurements and applicationsKLA TENCOR CORP·Filed 2009·Granted Oct 26, 2010·3 cites·11 claims
- 2067US9510747B2System and method for ophthalmic surface measurements based on objective quality estimationAMO DEV LLC·Filed 2013·Granted Dec 6, 2016·3 cites·12 claims
- 2166US9501621B2Treatment validation systems and methodsAMO DEV LLC·Filed 2014·Granted Nov 22, 2016·1 cites·17 claims
- 2265US10098783B2Tilt compensation, measurement, and associated adjustment of refractive prescriptions during surgical and other treatments of the eyeAMO DEV LLC·Filed 2015·Granted Oct 16, 2018·1 cites·18 claims
- 2365US7023549B2Parametric profiling using optical spectroscopic systemsKLA TENCOR TECH CORP·Filed 2004·Granted Apr 4, 2006·7 cites·10 claims
- 2460US10179070B2Systems and methods for laser beam direct measurement and error budgetAMO MFG USA LLC·Filed 2015·Granted Jan 15, 2019·1 cites·27 claims
- 2555US9814620B2Systems and methods for treatment deconvolution using multi-scale kernelsAMO DEV LLC·Filed 2016·Granted Nov 14, 2017·0 cites·23 claims
- 2655US9655513B2Wavefront measurement pre-smoothing systems and methodsAMO DEV LLC·Filed 2014·Granted May 23, 2017·0 cites·18 claims
- 2754US10292864B2Wavefront measurement pre-smoothing systems and methodsAMO DEV LLC·Filed 2017·Granted May 21, 2019·0 cites·9 claims
- 2853US9659151B2Systems and methods for treatment target deconvolutionAMO DEV LLC·Filed 2013·Granted May 23, 2017·0 cites·19 claims
- 2952US10098785B2Treatment validation systems and methodsAMO DEV LLC·Filed 2016·Granted Oct 16, 2018·0 cites·20 claims
- 3051US2017255757A1Systems and methods for treatment target deconvolutionAMO DEV LLC·Filed 2017·Application pending·0 cites
- 3144US2013138094A1System and method for ophthalmic surface measurements based on sequential estimatesAMO DEV LLC·Filed 2012·Application pending·0 cites
- 3244US2014135748A1Basis data apodization systems and methodsAMO DEV LLC·Filed 2013·Application pending·0 cites
- 3342US10028862B2Compensation systems and methods for flap induced aberrationsAMO DEV LLC·Filed 2013·Granted Jul 24, 2018·0 cites·11 claims
- 3439US2013190736A1Systems and methods for correcting high order aberrations in laser refractive surgeryFABRIKANT ANATOLY·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →