Inventor · disambiguated record
Anthony J. Suto
Also filed as: SUTO ANTHONY · SUTO ANTHONY J
15 granted patents·2 pending applications·190 citations·filing 1984–2024
92Inventor score
Top patents by PatentIndex Score
17 records- 0193US9459312B2Electronic assembly test systemTERADYNE INC·Filed 2013·Granted Oct 4, 2016·14 cites·21 claims
- 0289US9977052B2Test fixtureTERADYNE INC·Filed 2016·Granted May 22, 2018·4 cites·24 claims
- 0389US6175230B1Circuit-board tester with backdrive-based burst timingGENRAD INC·Filed 1999·Granted Jan 16, 2001·110 cites·7 claims
- 0481US9778314B2Capacitive opens testing of low profile componentsTERADYNE INC·Filed 2014·Granted Oct 3, 2017·4 cites·20 claims
- 0579US8618810B2Identifying fuel cell defectsSUTO ANTHONY J·Filed 2011·Granted Dec 31, 2013·3 cites·10 claims
- 0676US9638742B2Method and apparatus for testing electrical connections on a printed circuit boardSUTO ANTHONY J·Filed 2009·Granted May 2, 2017·8 cites·24 claims
- 0775US8604820B2Test access component for automatic testing of circuit assembliesSUTO ANTHONY J·Filed 2010·Granted Dec 10, 2013·3 cites·20 claims
- 0874US8310256B2Capacitive opens testing in low signal environmentsSUTO ANTHONY J·Filed 2009·Granted Nov 13, 2012·7 cites·30 claims
- 0968US10955465B2Method and apparatus for bond wire testing in an integrated circuitTERADYNE INC·Filed 2018·Granted Mar 23, 2021·1 cites·19 claims
- 1061US8760185B2Low capacitance probe for testing circuit assemblySUTO ANTHONY J·Filed 2009·Granted Jun 24, 2014·3 cites·21 claims
- 1161US8760183B2Fast open circuit detection for open power and ground pinsSUTO ANTHONY J·Filed 2009·Granted Jun 24, 2014·3 cites·28 claims
- 1259US4517511ACurrent probe signal processing circuit employing sample and hold technique to locate circuit faultsFAIRCHILD CAMERA INSTR CO·Filed 1984·Granted May 14, 1985·15 cites·18 claims
- 1358US2025347734A1Testing a circuit boardTERADYNE INC·Filed 2024·Application pending·0 cites
- 1448US10615230B2Identifying potentially-defective picture elements in an active-matrix display panelTERADYNE INC·Filed 2018·Granted Apr 7, 2020·0 cites·58 claims
- 1539US6114848ADirect-measurement provision of safe backdrive levelsGENRAD INC·Filed 1999·Granted Sep 5, 2000·13 cites·13 claims
- 1628US5103109AGround-loop interruption circuitGENRAD INC·Filed 1990·Granted Apr 7, 1992·2 cites·4 claims
- 1728US2017292873A1Vibration testing toolTERADYNE INC·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →