Inventor · disambiguated record
An-Chun Tu
Also filed as: TU AN-CHUN
16 granted patents·1 pending application·206 citations·filing 1998–2014
92Inventor score
Files withTAIWAN SEMICONDUCTOR MFG7HUANG KUAN-CHIEH3TU AN-CHUN3WINBOND ELECTRONICS CORP2TAIWAN SEMICONDUCTOR MAUFACTUR1
Top patents by PatentIndex Score
17 records- 0197US8247262B2Method for reducing contact resistance of CMOS image sensorHUANG KUAN-CHIEH·Filed 2010·Granted Aug 21, 2012·65 cites·20 claims
- 0293US8586404B2Method for reducing contact resistance of CMOS image sensorHUANG KUAN-CHIEH·Filed 2012·Granted Nov 19, 2013·15 cites·20 claims
- 0386US8674469B2Isolation structure for backside illuminated image sensorHUANG KUAN-CHIEH·Filed 2010·Granted Mar 18, 2014·7 cites·18 claims
- 0484US8704224B2Semiconductor test structuresTU AN-CHUN·Filed 2011·Granted Apr 22, 2014·5 cites·13 claims
- 0584US6309957B1Method of low-K/copper dual damasceneTAIWAN SEMICONDUCTOR MAUFACTUR·Filed 2000·Granted Oct 30, 2001·70 cites·26 claims
- 0681US6849546B1Method for improving interlevel dielectric gap filling over semiconductor structures having high aspect ratiosTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Feb 1, 2005·32 cites·30 claims
- 0768US9250286B2Semiconductor test structuresTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Feb 2, 2016·1 cites·20 claims
- 0865US8614131B2Self-aligned static random access memory (SRAM) on metal gateTU AN-CHUN·Filed 2009·Granted Dec 24, 2013·3 cites·20 claims
- 0958US9257326B2Method of making backside illuminated image sensorsTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Feb 9, 2016·0 cites·20 claims
- 1056US9377503B2Semiconductor test structuresTU AN-CHUN·Filed 2014·Granted Jun 28, 2016·0 cites·20 claims
- 1156US8946847B2Backside illuminated image sensors and method of making the sameTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Feb 3, 2015·0 cites·20 claims
- 1254US6828246B2Gas delivering deviceWINBOND ELECTRONICS CORP·Filed 2002·Granted Dec 7, 2004·4 cites·6 claims
- 1351US8352062B2Advanced process control for gate profile controlTAIWAN SEMICONDUCTOR MFG·Filed 2009·Granted Jan 8, 2013·0 cites·20 claims
- 1451US7119017B2Method for improving interlevel dielectric gap filling over semiconductor structures having high aspect ratiosTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Oct 10, 2006·1 cites·28 claims
- 1542US9330901B2Nitrogen-containing oxide film and method of forming the sameTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted May 3, 2016·0 cites·20 claims
- 1632US6030456AInstallation to supply gasWINBOND ELECTRONICS CORP·Filed 1998·Granted Feb 29, 2000·3 cites·10 claims
- 1719US2001050051A1Gas delivering deviceFiled 1998·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →