Inventor · disambiguated record
Armin Bich
Also filed as: BICH ARMIN
2 granted patents·2 pending applications·2 citations·filing 2007–2013
37Inventor score
Top patents by PatentIndex Score
4 records- 0163US8593642B2Method of measuring a shape of an optical surface based on computationally combined surface region measurements and interferometric measuring deviceFREIMANN ROLF·Filed 2012·Granted Nov 26, 2013·2 cites·13 claims
- 0249US2014078513A1Method of measuring a shape of an optical surface based on computationally combined surface region measurements and interferometric measuring deviceZEISS CARL SMT GMBH·Filed 2013·Application pending·0 cites
- 0336US8253947B2Device and method for measuring lithography masksHOF ALBRECHT·Filed 2007·Granted Aug 28, 2012·0 cites·17 claims
- 0436US2013083308A1Substrate holderZEISS CARL SMT GMBH·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →