Inventor · disambiguated record
Ariel Hildesheim
Also filed as: HILDESHEIM ARIEL
4 granted patents·2 pending applications·4 citations·filing 2018–2025
60Inventor score
Top patents by PatentIndex Score
6 records- 0187US12111580B2Optical metrology utilizing short-wave infrared wavelengthsKLA CORP·Filed 2021·Granted Oct 8, 2024·2 cites·38 claims
- 0282US11281111B2Off-axis illumination overlay measurement using two-diffracted orders imagingKLA TENCOR CORP·Filed 2018·Granted Mar 22, 2022·2 cites·29 claims
- 0356US2023324809A1Extra tall target metrologyKLA CORP·Filed 2022·Application pending·0 cites
- 0451US2025369905A1System and method for xrf inspectionRIGAKU SEMICONDUCTOR INSTR LTD·Filed 2025·Application pending·0 cites
- 0549US11637030B2Multi-stage, multi-zone substrate positioning systemsKLA CORP·Filed 2020·Granted Apr 25, 2023·0 cites·28 claims
- 0639US11430687B2Vacuum hold-down apparatus for flattening bowed semiconductor wafersKLA TENCOR CORP·Filed 2019·Granted Aug 30, 2022·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →