Inventor · disambiguated record
Atsuo Sawara
Also filed as: SAWARA ATSUO
2 granted patents·1 pending application·6 citations·filing 2007–2008
50Inventor score
Technology areasG01R
Top patents by PatentIndex Score
3 records- 0157US8145965B2Test apparatus for testing a device under test and device for receiving a signalNAGATANI KENICHI·Filed 2008·Granted Mar 27, 2012·4 cites·20 claims
- 0247US7808252B2Measurement apparatus and measurement methodADVANTEST CORP·Filed 2007·Granted Oct 5, 2010·2 cites·7 claims
- 0333US2009158100A1Jitter applying circuit and test apparatusADVANTEST CORP·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →