Inventor · disambiguated record
Avner Safrani
Also filed as: SAFRANI AVNER
16 granted patents·5 pending applications·61 citations·filing 2008–2024
89Inventor score
Files withKLA CORP11B G NEGEV TECHNOLOGIES AND APPLICATIONS LTD AT BEN GURION UNIV2KLA TENCOR CORP2TELISWITCH SOLUTIONS LTD2PHOTONICSYS LTD1
Top patents by PatentIndex Score
21 records- 0193US9880377B1Multiple wavelengths real time phase shift interference microscopyPHOTONICSYS LTD·Filed 2016·Granted Jan 30, 2018·39 cites·13 claims
- 0291US12066322B2Single grab overlay measurement of tall targetsKLA CORP·Filed 2022·Granted Aug 20, 2024·2 cites·40 claims
- 0386US11556738B2System and method for determining target feature focus in image-based overlay metrologyKLA CORP·Filed 2020·Granted Jan 17, 2023·2 cites·21 claims
- 0480US9310186B2True-spectroscopic dual mode high resolution full-field optical coherence tomography using liquid crystal devicesUNIV BEN GURION·Filed 2013·Granted Apr 12, 2016·6 cites·11 claims
- 0571US8235322B1Handling excess optical fiberZALITZKY YESHAYAHU·Filed 2009·Granted Aug 7, 2012·6 cites·20 claims
- 0670US11921825B2System and method for determining target feature focus in image-based overlay metrologyKLA CORP·Filed 2023·Granted Mar 5, 2024·0 cites·21 claims
- 0769US10782120B2Dual-interferometry wafer thickness gaugeKLA TENCOR CORP·Filed 2019·Granted Sep 22, 2020·1 cites·29 claims
- 0862US2024170318A1Teaching Substrate for Production and Process-Control ToolsKLA CORP·Filed 2024·Application pending·0 cites
- 0958US2025054872A1Overlay metrology target for die-to-wafer overlay metrologyKLA CORP·Filed 2024·Application pending·0 cites
- 1057US11774866B2Active reticle carrier for in situ stage correctionKLA CORP·Filed 2021·Granted Oct 3, 2023·0 cites·18 claims
- 1154US8094979B2Polarization-based optical switchingSAFRANI AVNER·Filed 2008·Granted Jan 10, 2012·2 cites·33 claims
- 1254US7813600B1Mechanical optical switchTELISWITCH SOLUTIONS LTD·Filed 2008·Granted Oct 12, 2010·3 cites·22 claims
- 1353US12372345B23D profilometry with a Linnik interferometerKLA CORP·Filed 2022·Granted Jul 29, 2025·0 cites·55 claims
- 1451US2025386098A1Method for fast focusing based on frequency domain linnik interferometryKLA CORP·Filed 2024·Application pending·0 cites
- 1550US2022344192A1Systems and methods for absolute sample positioningKLA CORP·Filed 2021·Application pending·0 cites
- 1649US11908722B2Automatic teaching of substrate handling for production and process-control toolsKLA CORP·Filed 2020·Granted Feb 20, 2024·0 cites·18 claims
- 1747US11512948B2Imaging system for buried metrology targetsKLA CORP·Filed 2020·Granted Nov 29, 2022·0 cites·52 claims
- 1842US10126582B2SWIR to visible up-conversion optical systemB G NEGEV TECHNOLOGIES AND APPLICATIONS LTD AT BEN GURION UNIV·Filed 2016·Granted Nov 13, 2018·0 cites·8 claims
- 1938US10190867B2Real time dual mode full-field optical coherence microscopy with full range imagingB G NEGEV TECHNOLOGIES AND APPLICATIONS LTD AT BEN GURION UNIV·Filed 2015·Granted Jan 29, 2019·0 cites·14 claims
- 2032US10354373B2System and method for photomask alignment and orientation characterization based on notch detectionKLA TENCOR CORP·Filed 2018·Granted Jul 16, 2019·0 cites·52 claims
- 2130US2011116739A1Mechanical optical switchTELISWITCH SOLUTIONS LTD·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →