Inventor · disambiguated record
Ayelet Pnueli
Also filed as: PNUELI AYELET
10 granted patents·3 pending applications·68 citations·filing 2001–2013
88Inventor score
Files withHEWLETT PACKARD DEVELOPMENT CO3APPLIED MATERIALS INC2PNUELI AYELET2AMICHAI NITSAN1APPLEID MATERIALS INC1
Top patents by PatentIndex Score
13 records- 0188US8212847B2Electrographic dot gain and optical density decoupling method, xerographic image reproduction, and systems, methods and software related theretoKELLA DROR·Filed 2006·Granted Jul 3, 2012·13 cites·19 claims
- 0285US8756571B2Natural language text instructionsBERGMAN RUTH·Filed 2010·Granted Jun 17, 2014·13 cites·20 claims
- 0375US8549478B2Graphical user interface input element identificationAMICHAI NITSAN·Filed 2009·Granted Oct 1, 2013·9 cites·15 claims
- 0474US8762873B2Graphical user interface component identificationPNUELI AYELET·Filed 2009·Granted Jun 24, 2014·8 cites·12 claims
- 0571US6605478B2Kill index analysis for automatic defect classification in semiconductor wafersAPPLEID MATERIALS INC·Filed 2001·Granted Aug 12, 2003·13 cites·22 claims
- 0665US7634188B2Method and apparatus for calculating a focus metricHEWLETT PACKARD DEVELOPMENT CO·Filed 2007·Granted Dec 15, 2009·4 cites·18 claims
- 0756US9104450B2Graphical user interface component classificationSCHEIN SAGI·Filed 2009·Granted Aug 11, 2015·3 cites·20 claims
- 0856US2016140514A1Proactive Management of DevicesHEWLETT PACKARD DEVELOPMENT CO·Filed 2013·Application pending·0 cites
- 0953US6673657B2Kill index analysis for automatic defect classification in semiconductor wafersAPPLIED MATERIALS INC·Filed 2002·Granted Jan 6, 2004·3 cites·5 claims
- 1050US8594384B2Method and system for measuring text-rendering qualityPNUELI AYELET·Filed 2007·Granted Nov 26, 2013·2 cites·14 claims
- 1148US2011099498A1Graphical user interface hierarchy generationBARKOL OMER·Filed 2009·Application pending·0 cites
- 1242US9063884B2Analysis of health indicators of a systemHEWLETT PACKARD DEVELOPMENT CO·Filed 2012·Granted Jun 23, 2015·0 cites·16 claims
- 1341US2003207519A1Kill index analysis for automatic defect classification in semiconductor wafersAPPLIED MATERIALS INC·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →