Inventor · disambiguated record
Bartolomeus Petrus Rijpers
Also filed as: RIJPERS BARTOLOMEUS P · RIJPERS BARTOLOMEUS PETRUS
6 granted patents·2 pending applications·17 citations·filing 2004–2018
75Inventor score
Top patents by PatentIndex Score
8 records- 0183US10416577B2Position measuring method of an alignment targetASML NETHERLANDS BV·Filed 2016·Granted Sep 17, 2019·3 cites·20 claims
- 0264US7629697B2Marker structure and method for controlling alignment of layers of a multi-layered substrateASML NETHERLANDS BV·Filed 2004·Granted Dec 8, 2009·10 cites·6 claims
- 0362US8609441B2Substrate comprising a markVAN HAREN RICHARD JOHANNES FRANCISCUS·Filed 2007·Granted Dec 17, 2013·2 cites·13 claims
- 0453US8722179B2Substrate comprising a markVAN HAREN RICHARD JOHANNES FRANCISCUS·Filed 2006·Granted May 13, 2014·2 cites·18 claims
- 0544US11106144B2Lithographic method and apparatusASML NETHERLANDS BV·Filed 2018·Granted Aug 31, 2021·0 cites·19 claims
- 0643US2015343461A1Deposition Method and ApparatusASML NETHERLANDS BV·Filed 2015·Application pending·0 cites
- 0739US2007093044A1Method of depositing a metal layer onto a substrate and a method for measuring in three dimensions the topographical features of a substrateASML NETHERLANDS BV·Filed 2005·Application pending·0 cites
- 0835US9116086B2Deposition method and apparatusRIJPERS BARTOLOMEUS PETRUS·Filed 2010·Granted Aug 25, 2015·0 cites·11 claims
Join the waitlist — get patent alerts
Get an alert when Bartolomeus Petrus Rijpers files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →