Inventor · disambiguated record
Bahadir Tunaboylu
Also filed as: TUNABOYLU BAHADIR
22 granted patents·5 pending applications·284 citations·filing 2001–2011
95Inventor score
Files withSV PROBE PTE LTD17DANG SON1K & S INTERCONNECT INC1KLAERNER PETER J1KULICKE & SOFFA IND INC1
Top patents by PatentIndex Score
27 records- 0192US7638028B2Probe tip platingSV PROBE PTE LTD·Filed 2005·Granted Dec 29, 2009·16 cites·16 claims
- 0292US7279911B2Probe card assembly with dielectric structureSV PROBE PTE LTD·Filed 2005·Granted Oct 9, 2007·23 cites·10 claims
- 0392US6908364B2Method and apparatus for probe tip cleaning and shaping padKULICKE & SOFFA IND INC·Filed 2001·Granted Jun 21, 2005·71 cites·18 claims
- 0487US7583098B2Automated probe card planarization and alignment methods and toolsSV PROBE PTE LTD·Filed 2007·Granted Sep 1, 2009·19 cites·11 claims
- 0586US7462800B2Method of shaping lithographically-produced probe elementsSV PROBE PTE LTD·Filed 2005·Granted Dec 9, 2008·16 cites·9 claims
- 0686US7271602B2Probe card assembly and method of attaching probes to the probe card assemblySV PROBE PTE LTD·Filed 2005·Granted Sep 18, 2007·11 cites·22 claims
- 0785US7721430B2Approach for fabricating cantilever probesSV PROBE PTE LTD·Filed 2007·Granted May 25, 2010·18 cites·20 claims
- 0885US7437813B2Probe repair methodsSV PROBE PTE LTD·Filed 2007·Granted Oct 21, 2008·21 cites·10 claims
- 0984US8299394B2Approach for assembling and repairing probe assemblies using laser weldingTHEPPAKUTTAI SENTHIL·Filed 2007·Granted Oct 30, 2012·22 cites·6 claims
- 1084US7637007B2Approach for fabricating cantilever probes for probe card assembliesSV PROBE PTE LTD·Filed 2007·Granted Dec 29, 2009·16 cites·16 claims
- 1179US7182672B2Method of probe tip shaping and cleaningSV PROBE PTE LTD·Filed 2005·Granted Feb 27, 2007·16 cites·23 claims
- 1277US7180315B2Substrate with patterned conductive layerSV PROBE LTD·Filed 2005·Granted Feb 20, 2007·8 cites·33 claims
- 1376US8004299B2Cantilever probe structure for a probe card assemblySV PROBE PTE LTD·Filed 2011·Granted Aug 23, 2011·3 cites·10 claims
- 1471US7898276B2Probe card with stacked substrateSV PROBE PTE LTD·Filed 2006·Granted Mar 1, 2011·4 cites·15 claims
- 1571US7495459B2Probe card assembly with a dielectric strip structure coupled to a side of at least a portion of the probesSV PROBE PTE LTD·Filed 2007·Granted Feb 24, 2009·3 cites·10 claims
- 1665US7637006B2Beam assembly method for large area array multi-beam DUT probe cardsSV PROBE PTE LTD·Filed 2007·Granted Dec 29, 2009·5 cites·17 claims
- 1763US7432728B2Blade probe and blade probe cardSV PROBE PTE LTD·Filed 2007·Granted Oct 7, 2008·4 cites·17 claims
- 1862US7675302B2Probe card assembly and method of attaching probes to the probe card assemblySV PROBE PTE LTD·Filed 2007·Granted Mar 9, 2010·1 cites·17 claims
- 1952US8430676B2Modular space transformer for fine pitch vertical probing applicationsDANG SON·Filed 2009·Granted Apr 30, 2013·3 cites·14 claims
- 2048US8058887B2Probe card assembly with interposer probesTUNABOYLU BAHADIR·Filed 2008·Granted Nov 15, 2011·4 cites·20 claims
- 2146US7374811B2Probe pad structure in a ceramic space transformerSV PROBE PTE LTD·Filed 2006·Granted May 20, 2008·0 cites·11 claims
- 2241US2007089551A1Cantilever probe structure for a probe card assemblySV PROBE PTD LTD·Filed 2006·Application pending·0 cites
- 2338US2009174423A1Bond Reinforcement Layer for Probe Test CardsKLAERNER PETER J·Filed 2009·Application pending·0 cites
- 2435US7733104B2Low force interconnects for probe cardsSV PROBE PTE LTD·Filed 2008·Granted Jun 8, 2010·0 cites·11 claims
- 2535US2006028220A1Reinforced probes for testing semiconductor devicesK & S INTERCONNECT INC·Filed 2005·Application pending·0 cites
- 2634US2007200576A1Multi-layered probesLAURENT EDWARD T·Filed 2007·Application pending·0 cites
- 2733US2010176831A1Probe Test Card with Flexible Interconnect StructurePALCISKO WILLIAM M·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →