Inventor · disambiguated record
Bernd Laquai
Also filed as: LAQUAI BERND
11 granted patents·3 pending applications·73 citations·filing 2001–2017
88Inventor score
Files withAGILENT TECHNOLOGIES INC3LAQUAI BERND3VERIGY PTE LTD SINGAPORE3ADVANTEST CORP2DAUB MICHAEL1
Top patents by PatentIndex Score
14 records- 0183US7355378B2Source synchronous samplingVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Apr 8, 2008·14 cites·15 claims
- 0279US7260493B2Testing a device under test by sampling its clock and data signalVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Aug 21, 2007·15 cites·15 claims
- 0373US9954546B2Removal of sampling clock jitter induced in an output signal of an analog-to-digital converterADVANTEST CORP·Filed 2017·Granted Apr 24, 2018·3 cites·30 claims
- 0470US6961745B2Filter for injecting data dependent jitter and level noiseAGILENT TECHNOLOGIES INC·Filed 2001·Granted Nov 1, 2005·16 cites·12 claims
- 0566US7434118B2Parameterized signal conditioningVERIGY PTE LTD SINGAPORE·Filed 2004·Granted Oct 7, 2008·14 cites·25 claims
- 0660US10234498B2Automated test equipment for testing a device under test and method for testing a device under testHORST JONAS·Filed 2016·Granted Mar 19, 2019·1 cites·20 claims
- 0758US7062393B2Polynomial fit for jitter separationAGILENT TECHNOLOGIES INC·Filed 2004·Granted Jun 13, 2006·5 cites·15 claims
- 0856US8326565B2Chip tester, method for providing timing information, test fixture set, apparatus for post-processing propagation delay information, method for post-processing delay information, chip test set up and method for testing devices under testDAUB MICHAEL·Filed 2007·Granted Dec 4, 2012·4 cites·28 claims
- 0947US8933718B2Signal distribution structure and method for distributing a signalLAQUAI BERND·Filed 2008·Granted Jan 13, 2015·1 cites·21 claims
- 1037US10768221B2Test equipment, method for operating a test equipment and computer programADVANTEST CORP·Filed 2017·Granted Sep 8, 2020·0 cites·21 claims
- 1136US2008208510A1Parameterized Signal ConditioningMOESSINGER MARC·Filed 2008·Application pending·0 cites
- 1235US2005075810A1Spectral jitter analysis allowing jitter modulation waveform analysisAGILENT TECHNOLOGIES INC·Filed 2004·Application pending·0 cites
- 1330US9300309B2Apparatus and method for source synchronous testing of signal convertersLAQUAI BERND·Filed 2010·Granted Mar 29, 2016·0 cites·17 claims
- 1429US2005243950A1Spectral jitter analysisLAQUAI BERND·Filed 2002·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Bernd Laquai files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →