Inventor · disambiguated record
Brian Duffy
Also filed as: DUFFY BRIAN · DUFFY BRIAN P · DUFFY BRIAN PATRICK
33 granted patents·3 pending applications·651 citations·filing 1997–2024
97Inventor score
Top patents by PatentIndex Score
36 records- 0197US9222895B2Generalized virtual inspectorKLA TENCOR CORP·Filed 2014·Granted Dec 29, 2015·96 cites·43 claims
- 0297US7877722B2Systems and methods for creating inspection recipesKLA TENCOR CORP·Filed 2007·Granted Jan 25, 2011·80 cites·20 claims
- 0396US9816939B2Virtual inspection systems with multiple modesKLA TENCOR CORP·Filed 2015·Granted Nov 14, 2017·29 cites·30 claims
- 0495US8126255B2Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functionsBHASKAR KRIS·Filed 2008·Granted Feb 28, 2012·174 cites·61 claims
- 0594US11415526B2Multi-controller inspection systemKLA CORP·Filed 2020·Granted Aug 16, 2022·4 cites·29 claims
- 0693US9916965B2Hybrid inspectorsKLA TENCOR CORP·Filed 2016·Granted Mar 13, 2018·13 cites·30 claims
- 0793US8194968B2Methods and systems for using electrical information for a device being fabricated on a wafer to perform one or more defect-related functionsPARK ALLEN·Filed 2008·Granted Jun 5, 2012·33 cites·85 claims
- 0892US10416088B2Virtual inspection systems with multiple modesKLA TENCOR CORP·Filed 2017·Granted Sep 17, 2019·7 cites·30 claims
- 0991US10832396B2And noise based care areasKLA TENCOR CORP·Filed 2019·Granted Nov 10, 2020·8 cites·34 claims
- 1091US9601393B2Selecting one or more parameters for inspection of a waferLEE CHRIS·Filed 2010·Granted Mar 21, 2017·17 cites·69 claims
- 1190US10276346B1Particle beam inspector with independently-controllable beamsKLA TENCOR CORP·Filed 2016·Granted Apr 30, 2019·9 cites·41 claims
- 1288US11580375B2Accelerated training of a machine learning based model for semiconductor applicationsKLA TENCOR CORP·Filed 2016·Granted Feb 14, 2023·9 cites·37 claims
- 1388US10267746B2Automated pattern fidelity measurement plan generationKLA TENCOR CORP·Filed 2015·Granted Apr 23, 2019·5 cites·27 claims
- 1488US9262821B2Inspection recipe setup from reference image variationKLA TENCOR CORP·Filed 2015·Granted Feb 16, 2016·8 cites·38 claims
- 1587US10713769B2Active learning for defect classifier trainingKLA TENCOR CORP·Filed 2019·Granted Jul 14, 2020·9 cites·36 claims
- 1687US10496781B2Metrology recipe generation using predicted metrology imagesKLA TENCOR CORP·Filed 2017·Granted Dec 3, 2019·6 cites·42 claims
- 1787US9183624B2Detecting defects on a wafer with run time use of design dataKLA TENCOR CORP·Filed 2014·Granted Nov 10, 2015·11 cites·94 claims
- 1886US11769242B2Mode selection and defect detection trainingKLA CORP·Filed 2020·Granted Sep 26, 2023·2 cites·20 claims
- 1986US10699926B2Identifying nuisances and defects of interest in defects detected on a waferKLA TENCOR CORP·Filed 2018·Granted Jun 30, 2020·7 cites·26 claims
- 2086US10127653B2Determining coordinates for an area of interest on a specimenKLA TENCOR CORP·Filed 2015·Granted Nov 13, 2018·7 cites·30 claims
- 2185US10539612B2Voltage contrast based fault and defect inference in logic chipsKLA TENCOR CORP·Filed 2016·Granted Jan 21, 2020·3 cites·38 claims
- 2285US8041106B2Methods and systems for detecting defects on a reticleKLA TENCOR CORP·Filed 2008·Granted Oct 18, 2011·40 cites·20 claims
- 2383US10359371B2Determining one or more characteristics of a pattern of interest on a specimenKLA TENCOR CORP·Filed 2016·Granted Jul 23, 2019·4 cites·27 claims
- 2480US10551827B2Hybrid inspection system for efficient process window discoveryKLA TENCOR CORP·Filed 2017·Granted Feb 4, 2020·2 cites·32 claims
- 2577US8537349B2Monitoring of time-varying defect classification performanceHUET PATRICK·Filed 2010·Granted Sep 17, 2013·6 cites·17 claims
- 2676US5865538AContainerized batch mixerREADCO MANUFACTURING INC·Filed 1997·Granted Feb 2, 1999·56 cites·13 claims
- 2765US10670535B2Automated pattern fidelity measurement plan generationKLA TENCOR CORP·Filed 2019·Granted Jun 2, 2020·0 cites·27 claims
- 2863US10402461B2Virtual inspection systems for process window characterizationKLA TENCOR CORP·Filed 2015·Granted Sep 3, 2019·1 cites·27 claims
- 2960US12480890B2Deep learning based mode selection for inspectionKLA CORP·Filed 2024·Granted Nov 25, 2025·0 cites·20 claims
- 3055US11922619B2Context-based defect inspectionKLA CORP·Filed 2023·Granted Mar 5, 2024·0 cites·27 claims
- 3153US2024169116A1Protecting data sources from different entities for semiconductor yield related applicationsKLA CORP·Filed 2023·Application pending·0 cites
- 3249US8410954B2Moving and stationary body system using telemetryDUFFY BRIAN P·Filed 2007·Granted Apr 2, 2013·3 cites·14 claims
- 3349US2008317930A1Creamy Wine-Based Beverage And Method For Producing Said BeverageDUFFY BRIAN PATRICK·Filed 2008·Application pending·0 cites
- 3448US10769761B2Generating high resolution images from low resolution images for semiconductor applicationsKLA TENCOR CORP·Filed 2018·Granted Sep 8, 2020·0 cites·24 claims
- 3546US6780656B2Correction of overlay offset between inspection layersHPL TECHNOLOGIES INC·Filed 2001·Granted Aug 24, 2004·2 cites·18 claims
- 3637US2009115629A1moving and stationary body system interfacing with a communications mediumHONEYWELL INT INC·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →