Inventor · disambiguated record
Brian Halvorson
Also filed as: HALVORSON BRIAN
7 granted patents·24 citations·filing 2013–2018
79Inventor score
Files withJOHNSTECH INT CORP7
Top patents by PatentIndex Score
7 records- 0192US9261537B2Wafer level integrated circuit contactor and method of constructionJOHNSTECH INT CORP·Filed 2013·Granted Feb 16, 2016·13 cites·10 claims
- 0290US9817026B2Wafer level integrated circuit contactor and method of constructionJOHNSTECH INT CORP·Filed 2016·Granted Nov 14, 2017·5 cites·11 claims
- 0386US10078101B2Wafer level integrated circuit probe array and method of constructionJOHNSTECH INT CORP·Filed 2015·Granted Sep 18, 2018·4 cites·8 claims
- 0460US9696347B2Testing apparatus and method for microcircuit and wafer level IC testingJOHNSTECH INT CORP·Filed 2014·Granted Jul 4, 2017·2 cites·13 claims
- 0556US10928423B2Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin ringsJOHNSTECH INT CORP·Filed 2018·Granted Feb 23, 2021·0 cites·24 claims
- 0653US10330702B2Wafer level integrated circuit probe array and method of constructionJOHNSTECH INT CORP·Filed 2018·Granted Jun 25, 2019·0 cites·12 claims
- 0751US10067164B2Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin ringsJOHNSTECH INT CORP·Filed 2016·Granted Sep 4, 2018·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →