Inventor · disambiguated record
Carl V. Reynolds
Also filed as: REYNOLDS CARL · REYNOLDS CARL V
17 granted patents·5 pending applications·339 citations·filing 1998–2010
95Inventor score
Top patents by PatentIndex Score
22 records- 0196US6920689B2Method for making a socket to perform testing on integrated circuitsFORMFACTOR INC·Filed 2002·Granted Jul 26, 2005·69 cites·44 claims
- 0295US7047638B2Method of making microelectronic spring contact arrayFORMFACTOR INC·Filed 2002·Granted May 23, 2006·84 cites·39 claims
- 0392US7482822B2Apparatus and method for limiting over travel in a probe card assemblyFORMFACTOR INC·Filed 2006·Granted Jan 27, 2009·16 cites·6 claims
- 0487US7649368B2Wafer level interposerFORMFACTOR INC·Filed 2008·Granted Jan 19, 2010·11 cites·20 claims
- 0587US7396236B2Wafer level interposerFORMFACTOR INC·Filed 2001·Granted Jul 8, 2008·29 cites·29 claims
- 0687US7084650B2Apparatus and method for limiting over travel in a probe card assemblyFORMFACTOR INC·Filed 2002·Granted Aug 1, 2006·30 cites·54 claims
- 0786US7724004B2Probing apparatus with guarded signal tracesFORMFACTOR INC·Filed 2006·Granted May 25, 2010·10 cites·23 claims
- 0883US7330039B2Method for making a socket to perform testing on integrated circuitsFORMFACTOR INC·Filed 2005·Granted Feb 12, 2008·10 cites·8 claims
- 0981US7024763B2Methods for making plated through holes usable as interconnection wire or probe attachmentsFORMFACTOR INC·Filed 2003·Granted Apr 11, 2006·19 cites·19 claims
- 1080US7498825B2Probe card assembly with an interchangeable probe insertFORMFACTOR INC·Filed 2005·Granted Mar 3, 2009·9 cites·18 claims
- 1174US7898242B2Probe card assembly with an interchangeable probe insertFORMFACTOR INC·Filed 2009·Granted Mar 1, 2011·6 cites·15 claims
- 1268US7128587B2Probe card covering system and methodFORMFACTOR INC·Filed 2005·Granted Oct 31, 2006·2 cites·22 claims
- 1367US7479792B2Methods for making plated through holes usable as interconnection wire or probe attachmentsFORMFACTOR INC·Filed 2006·Granted Jan 20, 2009·2 cites·11 claims
- 1463US8203351B2Probing apparatus with guarded signal tracesELDRIDGE BENJAMIN N·Filed 2010·Granted Jun 19, 2012·1 cites·22 claims
- 1561US6960923B2Probe card covering system and methodFORMFACTOR INC·Filed 2001·Granted Nov 1, 2005·6 cites·58 claims
- 1659US7843202B2Apparatus for testing devicesFORMFACTOR INC·Filed 2007·Granted Nov 30, 2010·3 cites·24 claims
- 1757US6090237AApparatus for restraining adhesive overflow in a multilayer substrate assembly during laminationFiled 1998·Granted Jul 18, 2000·32 cites·13 claims
- 1857US2009134897A1Apparatus and method for limiting over travel in a probe card assemblyFORMFACTOR INC·Filed 2009·Application pending·0 cites
- 1950US2008132095A1Method of making a socket to perform testing on integrated circuits and socket madeFORMFACTOR INC·Filed 2008·Application pending·0 cites
- 2050US2010120267A1Wafer level interposerFORMFACTOR INC·Filed 2010·Application pending·0 cites
- 2150US2006191136A1Method Of Making Microelectronic Spring Contact ArrayFORMFACTOR INC·Filed 2006·Application pending·0 cites
- 2237US2005108875A1Methods for making vertical electric feed through structures usable to form removable substrate tiles in a wafer test systemFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →