Inventor · disambiguated record
Ching-Yun Chang
Also filed as: CHANG CHING · CHANG CHING-YUN
17 granted patents·5 pending applications·99 citations·filing 2000–2024
92Inventor score
Files withUNITED MICROELECTRONICS CORP9TAIWAN SEMICONDUCTOR MFG CO LTD5LAM RES CORP2SEMICONDUCTOR MFG INT SHANGHAI CORP2IND TECH RES INST1
Top patents by PatentIndex Score
22 records- 0197US11296502B2Electrostatic discharge protection circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Apr 5, 2022·6 cites·20 claims
- 0296US11664657B2Charge dissipation element for ESD protectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted May 30, 2023·3 cites·20 claims
- 0395US9659937B2Semiconductor process of forming metal gates with different threshold voltages and semiconductor structure thereofUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 23, 2017·14 cites·20 claims
- 0485US12506336B2Charge dissipation element for ESD protectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Dec 23, 2025·0 cites·20 claims
- 0585US10134744B1Semiconductor memory deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Nov 20, 2018·11 cites·18 claims
- 0681US6767818B1Method for forming electrically conductive bumps and devices formedIND TECH RES INST·Filed 2000·Granted Jul 27, 2004·34 cites·16 claims
- 0780US12027847B2Charge dissipation element for ESD protectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jul 2, 2024·0 cites·20 claims
- 0879US9728467B2Method for modulating work function of semiconductor device having metal gate structure by gas treatmentUNITED MICROELECTRONICS CORP·Filed 2015·Granted Aug 8, 2017·3 cites·18 claims
- 0977US6772028B1Method for processing order changes in a manufacturing systemTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Aug 3, 2004·15 cites·21 claims
- 1065US9478628B1Metal gate forming processUNITED MICROELECTRONICS CORP·Filed 2015·Granted Oct 25, 2016·1 cites·16 claims
- 1165US7028898B2Layout structure of electrode lead wires for organic led displayWINTEK CORP·Filed 2002·Granted Apr 18, 2006·12 cites·14 claims
- 1262US11682586B2Semiconductor structure and fabrication methodSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2021·Granted Jun 20, 2023·0 cites·7 claims
- 1360US2025386599A1Protection of integrated circuit from esd and pid risksTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1456US11139384B2Method for fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2019·Granted Oct 5, 2021·0 cites·8 claims
- 1553US2025372367A1Deposition and etch of silicon-containing layerLAM RES CORP·Filed 2023·Application pending·0 cites
- 1652US11227803B2Semiconductor structure and fabrication methodSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2019·Granted Jan 18, 2022·0 cites·16 claims
- 1749US2024355624A1In-situ core protection in multi-patterningLAM RES CORP·Filed 2022·Application pending·0 cites
- 1847US10490643B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted Nov 26, 2019·0 cites·10 claims
- 1943US9691704B1Semiconductor structure and method for manufacturing the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jun 27, 2017·0 cites·15 claims
- 2041US2015061042A1Metal gate structure and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 2139US9576803B2Method for tuning metal gate work function before contact formation in fin-shaped field effect transistor manufacturing processUNITED MICROELECTRONICS CORP·Filed 2015·Granted Feb 21, 2017·0 cites·9 claims
- 2233US2003117543A1Structure of a display deviceFiled 2001·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Ching-Yun Chang files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →