Inventor · disambiguated record
Chih-Hsun Lin
Also filed as: LIN CHIH-HSUN
56 granted patents·18 pending applications·121 citations·filing 2004–2022
97Inventor score
Files withUNITED MICROELECTRONICS CORP14TAIWAN SEMICONDUCTOR MFG CO LTD10LIN MEI-HSUAN7TAIWAN SEMICONDUCTOR MFG7ACADEMIA SINICA4
Top patents by PatentIndex Score
74 records- 0195US8709901B1Method of forming an isolation structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Apr 29, 2014·26 cites·16 claims
- 0294US8779526B2Semiconductor deviceHSU CHUN-WEI·Filed 2011·Granted Jul 15, 2014·20 cites·11 claims
- 0390US11430733B2Method of testing waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 30, 2022·2 cites·20 claims
- 0490US10699960B2Methods for improving interlayer dielectric layer topographyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jun 30, 2020·6 cites·20 claims
- 0585US8533639B2Optical proximity correction for active region design layoutLIN MEI-HSUAN·Filed 2011·Granted Sep 10, 2013·7 cites·20 claims
- 0684US10818595B2Semiconductor structure, testing and fabricating methods thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Oct 27, 2020·3 cites·15 claims
- 0779US9966263B1Method of fabricating fin structureUNITED MICROELECTRONICS CORP·Filed 2017·Granted May 8, 2018·3 cites·16 claims
- 0877US8552486B2Forming metal-insulator-metal capacitors over a top metal layerWU KUN-MAO·Filed 2011·Granted Oct 8, 2013·6 cites·20 claims
- 0976US12009302B2Method of testing waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jun 11, 2024·0 cites·20 claims
- 1075US8741732B2Forming metal-insulator-metal capacitors over a top metal layerTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jun 3, 2014·3 cites·20 claims
- 1172US8879268B2Cooling system for an electronic rackLEE SHIH-CHANG·Filed 2012·Granted Nov 4, 2014·3 cites·11 claims
- 1272US8220513B1Laminator with changeable rotation speed and heating temperatureLIN CHIH-HSUN·Filed 2012·Granted Jul 17, 2012·2 cites·23 claims
- 1371US8551876B2Manufacturing method for semiconductor device having metal gateWANG YU-REN·Filed 2011·Granted Oct 8, 2013·5 cites·15 claims
- 1471US8064201B2Securing device and thermal module incorporating the sameKUO PO-HSUAN·Filed 2009·Granted Nov 22, 2011·9 cites·19 claims
- 1570US8994097B2MOS devices having non-uniform stressor dopingLIN MEI-HSUAN·Filed 2012·Granted Mar 31, 2015·2 cites·20 claims
- 1670US8643069B2Semiconductor device having metal gate and manufacturing method thereofHSU CHUN-WEI·Filed 2011·Granted Feb 4, 2014·2 cites·9 claims
- 1769US9978604B2Salicide formation using a cap layerTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted May 22, 2018·1 cites·19 claims
- 1868US10043653B2Maranagoni dry with low spin speed for charging releaseCHEN WEI CHENG·Filed 2012·Granted Aug 7, 2018·2 cites·22 claims
- 1968US8513143B2Semiconductor structure and method of manufacturingLIN MEI-HSUAN·Filed 2011·Granted Aug 20, 2013·2 cites·19 claims
- 2066US9825783B1Method and circuit for estimating channel state and associated receiverMSTAR SEMICONDUCTOR INC·Filed 2017·Granted Nov 21, 2017·1 cites·21 claims
- 2166US9673053B2Method for fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2014·Granted Jun 6, 2017·1 cites·3 claims
- 2266US9609786B2Cooling system for an electronic rackACADEMIA SINICA·Filed 2014·Granted Mar 28, 2017·1 cites·12 claims
- 2366US9443726B1Semiconductor processUNITED MICROELECTRONICS CORP·Filed 2015·Granted Sep 13, 2016·1 cites·20 claims
- 2466US9012300B2Manufacturing method for a shallow trench isolationUNITED MICROELECTRONICS CORP·Filed 2012·Granted Apr 21, 2015·2 cites·8 claims
- 2565US8775982B2Optical proximity correction for active region design layoutTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jul 8, 2014·2 cites·20 claims
- 2663US8765545B2Method of manufacturing a semiconductor deviceTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jul 1, 2014·1 cites·20 claims
- 2762US11257719B2Methods for improving interlayer dielectric layer topographyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 22, 2022·0 cites·20 claims
- 2861US8470660B2Method of manufacturing a semiconductor deviceLIN MEI-HSUAN·Filed 2011·Granted Jun 25, 2013·1 cites·20 claims
- 2958US10672777B2Method of manufacturing semiconductor device having multi-height structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 2, 2020·0 cites·20 claims
- 3057US2009047462A1Three-level recording phase-change optical discDAXON TECHNOLOGY INC·Filed 2007·Application pending·0 cites
- 3157US2020238645A1Process for making a wheel assembly for a lightweight vehicleWONDERLAND SWITZERLAND AG·Filed 2019·Application pending·0 cites
- 3255US2018261461A1Salicide formation using a cap layerTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Application pending·0 cites
- 3354US9024391B2Semiconductor structure having stressorTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted May 5, 2015·0 cites·20 claims
- 3454US8940600B2Method for fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2014·Granted Jan 27, 2015·0 cites·8 claims
- 3552US9343318B2Salicide formation using a cap layerLIN MEI-HSUAN·Filed 2012·Granted May 17, 2016·0 cites·5 claims
- 3652US8836088B2Semiconductor structure having etch stop layerTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Sep 16, 2014·0 cites·20 claims
- 3752US7821883B2Computer system and method capable of automatically duplicating data into discsDAXON TECHNOLOGY INC·Filed 2007·Granted Oct 26, 2010·0 cites·25 claims
- 3851US10211214B2Semiconductor device having milti-height structure and method of manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Feb 19, 2019·0 cites·20 claims
- 3950US2014106558A1Semiconductor device having metal gate and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 4048US9299600B2Method for repairing an oxide layer and method for manufacturing a semiconductor structure applying the sameUNITED MICROELECTRONICS CORP·Filed 2014·Granted Mar 29, 2016·0 cites·16 claims
- 4148US9209270B2MOS devices having non-uniform stressor dopingTAIWAN SEMICONDUCTOR MFG·Filed 2015·Granted Dec 8, 2015·0 cites·19 claims
- 4248US7408753B2Surge-protected networking power stripPRIMAX ELECTRONICS LTD·Filed 2004·Granted Aug 5, 2008·2 cites·13 claims
- 4347US8846492B2Integrated circuit having a stressor and method of forming the sameLIN MEI-HSUAN·Filed 2011·Granted Sep 30, 2014·0 cites·20 claims
- 4447US2016351674A1Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2016·Application pending·0 cites
- 4546US10037927B2Semiconductor structure, testing and fabricating method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jul 31, 2018·0 cites·20 claims
- 4646US9466535B2Method of forming target patternsUNITED MICROELECTRONICS CORP·Filed 2015·Granted Oct 11, 2016·0 cites·19 claims
- 4746US2022390628A1Particle induced radiography systemACADEMIA SINICA·Filed 2022·Application pending·0 cites
- 4844US10809469B1Laser diode edge assembly structure for three-dimensional active alignment in transmitter optical assemblyCLOUD LIGHT TECH LIMITED·Filed 2019·Granted Oct 20, 2020·0 cites·18 claims
- 4944US7829167B2Disc having relief pattern and transprint method thereofBENQ MATERIALS CORP·Filed 2007·Granted Nov 9, 2010·0 cites·15 claims
- 5044US2013110140A1Anastomosis systemUNIV NAT YANG MING·Filed 2012·Application pending·0 cites
Showing the top 50 of 74 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →