Inventor · disambiguated record
Chris Maher
Also filed as: MAHER CHRIS
9 granted patents·3 pending applications·266 citations·filing 2007–2019
88Inventor score
Top patents by PatentIndex Score
12 records- 0195US8126255B2Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functionsBHASKAR KRIS·Filed 2008·Granted Feb 28, 2012·174 cites·61 claims
- 0291US10832396B2And noise based care areasKLA TENCOR CORP·Filed 2019·Granted Nov 10, 2020·8 cites·34 claims
- 0391US8135204B1Computer-implemented methods, carrier media, and systems for creating a defect sample for use in selecting one or more parameters of an inspection recipeCHEN CHIEN-HUEI ADAM·Filed 2007·Granted Mar 13, 2012·33 cites·26 claims
- 0489US8073240B2Computer-implemented methods, computer-readable media, and systems for identifying one or more optical modes of an inspection system as candidates for use in inspection of a layer of a waferFISCHER VERLYN·Filed 2008·Granted Dec 6, 2011·28 cites·19 claims
- 0587US8000922B2Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithmKLA TENCOR CORP·Filed 2008·Granted Aug 16, 2011·16 cites·20 claims
- 0677US8537349B2Monitoring of time-varying defect classification performanceHUET PATRICK·Filed 2010·Granted Sep 17, 2013·6 cites·17 claims
- 0770US10604433B2Emancipative waste activated sludge stripping to remove internal phosphorus (“eWASSTRIP”)CLEAN WATER SERVICES·Filed 2018·Granted Mar 31, 2020·1 cites·20 claims
- 0849US11114324B2Defect candidate generation for inspectionKLA CORP·Filed 2019·Granted Sep 7, 2021·0 cites·22 claims
- 0947US9489599B2Decision tree construction for automatic classification of defects on semiconductor wafersKLA TENCOR CORP·Filed 2014·Granted Nov 8, 2016·0 cites·33 claims
- 1045US2014223634A1Dual layer cooling fabricRealXGear·Filed 2013·Application pending·0 cites
- 1145US2014361101A1Personal misting deviceRealXGear·Filed 2013·Application pending·0 cites
- 1238US2012028624A1System and method for improving mobile device safety by selectively disabling device features during unsafe operational conditionsJEDLICKA MAYA P·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →