Inventor · disambiguated record
Charles A. Miller
Also filed as: MILLER CHARLES · MILLER CHARLES A · MILLER CHARLES ANDREW
147 granted patents·10 pending applications·8,079 citations·filing 1988–2012
99Inventor score
Files withFORMFACTOR INC109ZUMBIEL C W CO12CREDENCE SYSTEMS CORP11MILLER CHARLES A6THE C W ZUMBIEL CO6
Top patents by PatentIndex Score
157 records- 0199US7928750B2Contactless interfacing of test signals with a device under testFORMFACTOR INC·Filed 2008·Granted Apr 19, 2011·133 cites·14 claims
- 0299US6339338B1Apparatus for reducing power supply noise in an integrated circuitFORMFACTOR INC·Filed 2000·Granted Jan 15, 2002·167 cites·22 claims
- 0399US6218910B1High bandwidth passive integrated circuit tester probe card assemblyFORMFACTOR INC·Filed 1999·Granted Apr 17, 2001·251 cites·22 claims
- 0499US6208225B1Filter structures for integrated circuit interfacesFORMFACTOR INC·Filed 1999·Granted Mar 27, 2001·225 cites·39 claims
- 0598US7889022B2Electromagnetically coupled interconnect system architectureFORMFACTOR INC·Filed 2009·Granted Feb 15, 2011·72 cites·20 claims
- 0698US7612630B2Electromagnetically coupled interconnect system architectureFORMFACTOR INC·Filed 2005·Granted Nov 3, 2009·84 cites·20 claims
- 0798US6891385B2Probe card cooling assembly with direct cooling of active electronic componentsFORMFACTOR INC·Filed 2001·Granted May 10, 2005·126 cites·16 claims
- 0898US6816031B1Adjustable delay transmission lineFORMFACTOR INC·Filed 2001·Granted Nov 9, 2004·115 cites·24 claims
- 0998US6798225B2Tester channel to multiple IC terminalsFORMFACTOR INC·Filed 2002·Granted Sep 28, 2004·116 cites·21 claims
- 1098US6686754B2Integrated circuit tester with high bandwidth probe assemblyFORMFACTOR INC·Filed 2002·Granted Feb 3, 2004·114 cites·19 claims
- 1198US6678850B2Distributed interface for parallel testing of multiple devices using a single tester channelFORMFACTOR INC·Filed 2002·Granted Jan 13, 2004·135 cites·20 claims
- 1298US6657455B2Predictive, adaptive power supply for an integrated circuit under testFORMFACTOR INC·Filed 2002·Granted Dec 2, 2003·114 cites·24 claims
- 1398US6603323B1Closed-grid bus architecture for wafer interconnect structureFORMFACTOR INC·Filed 2000·Granted Aug 5, 2003·126 cites·9 claims
- 1498US6539531B2Method of designing, fabricating, testing and interconnecting an IC to external circuit nodesFORMFACTOR INC·Filed 2000·Granted Mar 25, 2003·206 cites·29 claims
- 1598US6501343B2Integrated circuit tester with high bandwidth probe assemblyFORMFACTOR INC·Filed 2001·Granted Dec 31, 2002·125 cites·17 claims
- 1698US6456103B1Apparatus for reducing power supply noise in an integrated circuitFORMFACTOR INC·Filed 2001·Granted Sep 24, 2002·116 cites·4 claims
- 1797US7227371B2High performance probe systemFORMFACTOR INC·Filed 2005·Granted Jun 5, 2007·48 cites·33 claims
- 1897US6917210B2Integrated circuit tester with high bandwidth probe assemblyFORMFACTOR INC·Filed 2003·Granted Jul 12, 2005·78 cites·6 claims
- 1997US6910268B2Method for fabricating an IC interconnect system including an in-street integrated circuit wafer viaFORMFACTOR INC·Filed 2001·Granted Jun 28, 2005·175 cites·9 claims
- 2097US6882546B2Multiple die interconnect systemFORMFACTOR INC·Filed 2001·Granted Apr 19, 2005·97 cites·12 claims
- 2197US6882239B2Electromagnetically coupled interconnect systemFORMFACTOR INC·Filed 2001·Granted Apr 19, 2005·120 cites·41 claims
- 2297US6845491B2Method of designing, fabricating, testing and interconnecting an IC to external circuit nodesFORMFACTOR INC·Filed 2003·Granted Jan 18, 2005·131 cites·37 claims
- 2397US6784677B2Closed-grid bus architecture for wafer interconnect structureFORMFACTOR INC·Filed 2003·Granted Aug 31, 2004·75 cites·22 claims
- 2497US6784674B2Test signal distribution system for IC testerFORMFACTOR INC·Filed 2002·Granted Aug 31, 2004·96 cites·32 claims
- 2597US6680659B2Integrated circuit interconnect systemFORMFACTOR INC·Filed 2002·Granted Jan 20, 2004·130 cites·27 claims
- 2697US6622103B1System for calibrating timing of an integrated circuit wafer testerFORMFACTOR INC·Filed 2000·Granted Sep 16, 2003·134 cites·16 claims
- 2797US6606575B2Cross-correlation timing calibration for wafer-level IC tester interconnect systemsFORMFACTOR INC·Filed 2000·Granted Aug 12, 2003·109 cites·22 claims
- 2897US6559671B2Efficient parallel testing of semiconductor devices using a known good device to generate expected responsesFORMFACTOR INC·Filed 2002·Granted May 6, 2003·90 cites·5 claims
- 2997US6499121B1Distributed interface for parallel testing of multiple devices using a single tester channelFORMFACTOR INC·Filed 1999·Granted Dec 24, 2002·161 cites·9 claims
- 3097US6452411B1Efficient parallel testing of integrated circuit devices using a known good device to generate expected responsesFORMFACTOR INC·Filed 1999·Granted Sep 17, 2002·158 cites·26 claims
- 3196US6965244B2High performance probe systemFORMFACTOR INC·Filed 2002·Granted Nov 15, 2005·64 cites·52 claims
- 3296US6949942B2Predictive, adaptive power supply for an integrated circuit under testFORMFACTOR INC·Filed 2003·Granted Sep 27, 2005·61 cites·15 claims
- 3396US6812691B2Compensation for test signal degradation due to DUT faultFORMFACTOR INC·Filed 2002·Granted Nov 2, 2004·84 cites·23 claims
- 3496US6538538B2High frequency printed circuit board viaFORMFACTOR INC·Filed 2001·Granted Mar 25, 2003·136 cites·30 claims
- 3595US7342405B2Apparatus for reducing power supply noise in an integrated circuitFORMFACTOR INC·Filed 2002·Granted Mar 11, 2008·74 cites·31 claims
- 3695US7108546B2High density planar electrical interfaceFORMFACTOR INC·Filed 2001·Granted Sep 19, 2006·61 cites·22 claims
- 3795US7000803B2Contoured carton with dispenserZUMBIEL C W CO·Filed 2003·Granted Feb 21, 2006·113 cites·6 claims
- 3895US6911835B2High performance probe systemFORMFACTOR INC·Filed 2003·Granted Jun 28, 2005·127 cites·18 claims
- 3995US6822529B2Integrated circuit interconnect systemFORMFACTOR INC·Filed 2003·Granted Nov 23, 2004·79 cites·9 claims
- 4095US6646520B2Integrated circuit interconnect systemFORMFACTOR INC·Filed 2002·Granted Nov 11, 2003·88 cites·12 claims
- 4195US6606014B2Filter structures for integrated circuit interfacesFORMFACTOR INC·Filed 2001·Granted Aug 12, 2003·77 cites·34 claims
- 4295US4984992ACable connector with a low inductance pathAMP INC·Filed 1989·Granted Jan 15, 1991·117 cites·21 claims
- 4395US4919266ACarton with end wall display windowZUMBIEL C W CO·Filed 1989·Granted Apr 24, 1990·163 cites·12 claims
- 4494US8118212B2Carton with dispenserMILLER CHARLES A·Filed 2010·Granted Feb 21, 2012·20 cites·5 claims
- 4594US7952375B2AC coupled parameteric test probeFORMFACTOR INC·Filed 2006·Granted May 31, 2011·25 cites·20 claims
- 4694US7609080B2Voltage fault detection and protectionFORMFACTOR INC·Filed 2005·Granted Oct 27, 2009·26 cites·16 claims
- 4794US7245134B2Probe card assembly including a programmable device to selectively route signals from channels of a test system controller to probesFORMFACTOR INC·Filed 2005·Granted Jul 17, 2007·64 cites·14 claims
- 4894US6911814B2Apparatus and method for electromechanical testing and validation of probe cardsFORMFACTOR INC·Filed 2003·Granted Jun 28, 2005·98 cites·28 claims
- 4994US6661316B2High frequency printed circuit board viaFORMFACTOR INC·Filed 2002·Granted Dec 9, 2003·87 cites·17 claims
- 5094US6459343B1Integrated circuit interconnect system forming a multi-pole filterFORMFACTOR INC·Filed 2000·Granted Oct 1, 2002·86 cites·12 claims
Showing the top 50 of 157 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Charles A. Miller files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →