Inventor · disambiguated record
Christof Riedesel
Also filed as: RIEDESEL CHRISTOF
20 granted patents·2 pending applications·312 citations·filing 2011–2024
95Inventor score
Files withCARL ZEISS MULTISEM GMBH12ZEISS CARL MICROSCOPY GMBH7APPLIED MATERIALS ISRAEL LTD1ZEIDLER DIRK1ZEISS CARL SMT GMBH1
Top patents by PatentIndex Score
22 records- 0196US11562881B2Charged particle beam systemCARL ZEISS MULTISEM GMBH·Filed 2021·Granted Jan 24, 2023·3 cites·26 claims
- 0296US11164715B2Charged particle beam systemCARL ZEISS MULTISEM GMBH·Filed 2020·Granted Nov 2, 2021·4 cites·23 claims
- 0396US10811215B2Charged particle beam systemCARL ZEISS MULTISEM GMBH·Filed 2019·Granted Oct 20, 2020·35 cites·20 claims
- 0496US10741355B1Multi-beam charged particle systemZEISS CARL MICROSCOPY GMBH·Filed 2019·Granted Aug 11, 2020·44 cites·20 claims
- 0596US10600613B2Particle beam systemZEISS CARL MICROSCOPY GMBH·Filed 2018·Granted Mar 24, 2020·33 cites·10 claims
- 0695US9653254B2Particle-optical systems and arrangements and particle-optical components for such systems and arrangementsAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted May 16, 2017·33 cites·22 claims
- 0794US10854423B2Multi-beam particle beam systemCARL ZEISS MULTISEM GMBH·Filed 2019·Granted Dec 1, 2020·31 cites·22 claims
- 0894US9991089B2Particle beam system and method for operating a particle optical unitZEISS CARL MICROSCOPY GMBH·Filed 2017·Granted Jun 5, 2018·34 cites·24 claims
- 0994US9536702B2Multi-beam particle microscope and method for operating sameZEISS CARL MICROSCOPY GMBH·Filed 2015·Granted Jan 3, 2017·65 cites·20 claims
- 1093US9552957B2Particle beam systemZEISS CARL MICROSCOPY GMBH·Filed 2015·Granted Jan 24, 2017·10 cites·23 claims
- 1189US9799485B2Particle beam system and method for operating a particle optical unitZEISS CARL MICROSCOPY GMBH·Filed 2015·Granted Oct 24, 2017·8 cites·10 claims
- 1286US9384938B2Particle-optical systems and arrangements and particle-optical components for such systems and arrangementsZEIDLER DIRK·Filed 2011·Granted Jul 5, 2016·9 cites·18 claims
- 1385US10147582B2Particle beam systemZEISS CARL MICROSCOPY GMBH·Filed 2017·Granted Dec 4, 2018·3 cites·20 claims
- 1467US11239054B2Multi-beam particle beam systemCARL ZEISS MULTISEM GMBH·Filed 2020·Granted Feb 1, 2022·0 cites·21 claims
- 1566US11087948B2Multi-beam charged particle systemCARL ZEISS MULTISEM GMBH·Filed 2020·Granted Aug 10, 2021·0 cites·20 claims
- 1662US2024274398A1Method of global and local optimization of imaging resolution in a multibeam systemCARL ZEISS MULTISEM GMBH·Filed 2024·Application pending·0 cites
- 1757US2024379322A1Multi-beam system and multi-beam generating unit with reduced sensitivity to drift and damagesCARL ZEISS MULTISEM GMBH·Filed 2024·Application pending·0 cites
- 1854US11645740B2Method for detector equalization during the imaging of objects with a multi-beam particle microscopeCARL ZEISS MULTISEM GMBH·Filed 2021·Granted May 9, 2023·0 cites·21 claims
- 1952US11728130B2Method of recording an image using a particle microscopeZEISS CARL SMT GMBH·Filed 2021·Granted Aug 15, 2023·0 cites·26 claims
- 2051US12431324B2Multi-beam digital scan and image acquisitionCARL ZEISS MULTISEM GMBH·Filed 2022·Granted Sep 30, 2025·0 cites·22 claims
- 2150US12283457B2Multiple particle beam microscope and associated method with an improved focus setting taking into account an image plane tiltCARL ZEISS MULTISEM GMBH·Filed 2022·Granted Apr 22, 2025·0 cites·16 claims
- 2249US12255040B2Multi-beam particle beam system and method for operating sameCARL ZEISS MULTISEM GMBH·Filed 2021·Granted Mar 18, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →