Inventor · disambiguated record
Chen Wang
Also filed as: WANG CHEN · WANG CHEN-WAN
23 granted patents·1 pending application·353 citations·filing 2004–2021
96Inventor score
Top patents by PatentIndex Score
24 records- 0195US7437640B2Fault diagnosis of compressed test responses having one or more unknown statesRAJSKI JANUSZ·Filed 2005·Granted Oct 14, 2008·37 cites·24 claims
- 0295US7370254B2Compressing test responses using a compactorRAJSKI JANUSZ·Filed 2004·Granted May 6, 2008·82 cites·43 claims
- 0394US7302624B2Adaptive fault diagnosis of compressed test responsesRAJSKI JANUSZ·Filed 2005·Granted Nov 27, 2007·45 cites·28 claims
- 0493US11320487B1Programmable test compactor for improving defect determinationSIEMENS IND SOFTWARE INC·Filed 2021·Granted May 3, 2022·2 cites·20 claims
- 0593US7890827B2Compressing test responses using a compactorMENTOR GRAPHICS CORP·Filed 2010·Granted Feb 15, 2011·11 cites·15 claims
- 0693US7509550B2Fault diagnosis of compressed test responsesRAJSKI JANUSZ·Filed 2005·Granted Mar 24, 2009·36 cites·32 claims
- 0789US9086454B2Timing-aware test generation and fault simulationMENTOR GRAPHICS CORP·Filed 2013·Granted Jul 21, 2015·8 cites·13 claims
- 0889US7743302B2Compressing test responses using a compactorRAJSKI JANUSZ·Filed 2008·Granted Jun 22, 2010·17 cites·30 claims
- 0988US7890806B2Auto-executing tool for developing test harness filesALCATEL LUCENT USA INC·Filed 2005·Granted Feb 15, 2011·29 cites·24 claims
- 1085US7689973B2Language for development of test harness filesALCATEL LUCENT USA INC·Filed 2005·Granted Mar 30, 2010·20 cites·22 claims
- 1185US7669101B2Methods for distributing programs for generating test dataUDELL JON·Filed 2008·Granted Feb 23, 2010·12 cites·24 claims
- 1283US8051352B2Timing-aware test generation and fault simulationMENTOR GRAPHICS CORP·Filed 2007·Granted Nov 1, 2011·9 cites·24 claims
- 1381US9720040B2Timing-aware test generation and fault simulationMENTOR GRAPHICS CORP·Filed 2015·Granted Aug 1, 2017·2 cites·17 claims
- 1480US7702958B2Auto-recording tool for developing test harness filesALCATEL LUCENT USA INC·Filed 2005·Granted Apr 20, 2010·13 cites·23 claims
- 1577US7386778B2Methods for distributing programs for generating test dataUDELL JON·Filed 2005·Granted Jun 10, 2008·8 cites·39 claims
- 1671US8201131B2Generating test patterns having enhanced coverage of untargeted defectsRAJSKI JANUSZ·Filed 2009·Granted Jun 12, 2012·4 cites·24 claims
- 1768US9651622B2Isometric test compression with low toggling activityMENTOR GRAPHICS CORP·Filed 2015·Granted May 16, 2017·1 cites·20 claims
- 1868US7962820B2Fault diagnosis of compressed test responsesMENTOR GRAPHICS CORP·Filed 2009·Granted Jun 14, 2011·4 cites·20 claims
- 1966US8560906B2Timing-aware test generation and fault simulationLIN XIJIANG·Filed 2011·Granted Oct 15, 2013·1 cites·17 claims
- 2066US7509600B2Generating test patterns having enhanced coverage of untargeted defectsRAJSKI JANUSZ·Filed 2004·Granted Mar 24, 2009·10 cites·58 claims
- 2159US10977400B2Deterministic test pattern generation for designs with timing exceptionsMENTOR GRAPHICS CORP·Filed 2019·Granted Apr 13, 2021·0 cites·20 claims
- 2259US10509073B2Timing-aware test generation and fault simulationLIN XIJIANG·Filed 2017·Granted Dec 17, 2019·0 cites·11 claims
- 2355US7765450B2Methods for distribution of test generation programsUDELL JON·Filed 2005·Granted Jul 27, 2010·2 cites·8 claims
- 2445US2008320352A1Methods for distribution of test generation programsMENTOR GRAPHICS CORP·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →