Inventor · disambiguated record
Christophe Wouters
Also filed as: WOUTERS CHRISTOPHE
9 granted patents·2 pending applications·16 citations·filing 2011–2023
83Inventor score
Top patents by PatentIndex Score
11 records- 0194US11726126B2Apparatus, method and computer program product for defect detection in work piecesKLA CORP·Filed 2021·Granted Aug 15, 2023·2 cites·18 claims
- 0293US10935503B2Apparatus, method and computer program product for defect detection in work piecesKLA TENCOR CORP·Filed 2019·Granted Mar 2, 2021·5 cites·52 claims
- 0393US10324044B2Apparatus, method and computer program product for defect detection in work piecesKLA TENCOR CORP·Filed 2016·Granted Jun 18, 2019·6 cites·22 claims
- 0482US2023393185A1Apparatus, method and computer program product for defect detection in work piecesKLA CORP·Filed 2023·Application pending·0 cites
- 0574US11105839B2Apparatus, method and computer program product for defect detection in work piecesKLA CORP·Filed 2020·Granted Aug 31, 2021·0 cites·25 claims
- 0671US11892493B2Apparatus, method and computer program product for defect detection in work piecesKLA CORP·Filed 2020·Granted Feb 6, 2024·0 cites·25 claims
- 0767US9778192B2Object carrier, system and method for back light inspectionKLA TENCOR CORP·Filed 2015·Granted Oct 3, 2017·1 cites·20 claims
- 0862US9140546B2Apparatus and method for three dimensional inspection of wafer saw marksMAISON BENOIT·Filed 2011·Granted Sep 22, 2015·2 cites·28 claims
- 0944US10866092B2Chromatic confocal area sensorKLA TENCOR CORP·Filed 2019·Granted Dec 15, 2020·0 cites·18 claims
- 1041US2014185136A1Multi directional illumination for a microscope and microscopeKLA TENCOR CORP·Filed 2014·Application pending·0 cites
- 1140US11340284B2Combined transmitted and reflected light imaging of internal cracks in semiconductor devicesKLA CORP·Filed 2020·Granted May 24, 2022·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →