Inventor · disambiguated record
Curt H. Chadwick
Also filed as: CHADWICK CURT · CHADWICK CURT H · RADECKI DAN J
18 granted patents·4 pending applications·1,462 citations·filing 1975–2008
96Inventor score
Top patents by PatentIndex Score
22 records- 0196US4877326AMethod and apparatus for optical inspection of substratesKLA INSTR CORP·Filed 1988·Granted Oct 31, 1989·263 cites·56 claims
- 0295US5502306AElectron beam inspection system and methodKLA INSTR CORP·Filed 1994·Granted Mar 26, 1996·400 cites·35 claims
- 0395US4618938AMethod and apparatus for automatic wafer inspectionKLA INSTR CORP·Filed 1984·Granted Oct 21, 1986·247 cites·25 claims
- 0493US4556317AX-Y Stage for a patterned wafer automatic inspection systemKLA INSTR CORP·Filed 1984·Granted Dec 3, 1985·112 cites·18 claims
- 0588US5131755AAutomatic high speed optical inspection systemCHADWICK CURT H·Filed 1989·Granted Jul 21, 1992·83 cites·12 claims
- 0687US4639587AAutomatic focusing system for a microscopeKLA INSTR CORP·Filed 1985·Granted Jan 27, 1987·81 cites·20 claims
- 0786US6141038AAlignment correction prior to image sampling in inspection systemsKLA INSTR CORP·Filed 1997·Granted Oct 31, 2000·82 cites·28 claims
- 0883US5085517AAutomatic high speed optical inspection systemCHADWICK CURT H·Filed 1989·Granted Feb 4, 1992·65 cites·56 claims
- 0977US4023891AAdjustable mirror mount assemblyGTE SYLVANIA INC·Filed 1975·Granted May 17, 1977·31 cites·7 claims
- 1070US4647764ARotational and focusing apparatus for turret mounted lensesKLA INSTR CORP·Filed 1984·Granted Mar 3, 1987·26 cites·22 claims
- 1167US4604910AApparatus for accurately positioning an object at each of two locationsKLA INSTR CORP·Filed 1984·Granted Aug 12, 1986·21 cites·7 claims
- 1265USRE37740EMethod and apparatus for optical inspection of substratesKLA TENCOR CORP·Filed 1995·Granted Jun 11, 2002·26 cites·56 claims
- 1354US4199735AOptical compensation for thermal lensing in conductively cooled laser rodGTE SYLVANIA INC·Filed 1978·Granted Apr 22, 1980·8 cites·3 claims
- 1448US2008304734A1Alignment correction prio to image sampling in inspection systemsKLA INSTR CORP·Filed 2008·Application pending·0 cites
- 1544US4170763AConductively cooled laser pumping assemblyGTE SYLVANIA INC·Filed 1978·Granted Oct 9, 1979·6 cites·7 claims
- 1644US2005254698A1Alignment correction prior to image sampling in inspection systemsKLA INSTR CORP·Filed 2005·Application pending·0 cites
- 1739US2002075385A1Alignment correction prior to image sampling in inspection systemsKLA INSTR CORP·Filed 2002·Application pending·0 cites
- 1839US2003063190A1Alignment correction prior to image sampling in inspection systemsKLA INSTR CORP·Filed 2002·Application pending·0 cites
- 1937US4181900ALaser pumping assemblyGTE SYLVANIA INC·Filed 1978·Granted Jan 1, 1980·4 cites·1 claims
- 2030US4889676AMethod of molding a precision surface on an instrument tableKLA INSTR CORP·Filed 1988·Granted Dec 26, 1989·3 cites·4 claims
- 2127US5014627AStable instrument bench with replicated precision surfaceKLA INSTR CORP·Filed 1989·Granted May 14, 1991·1 cites·15 claims
- 2225US4183483ATranslating mechanismGTE SYLVANIA INC·Filed 1978·Granted Jan 15, 1980·3 cites·11 claims
Join the waitlist — get patent alerts
Get an alert when Curt H. Chadwick files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →