Inventor · disambiguated record
David Owen
Also filed as: OWEN DAVID · OWEN DAVID M · OWEN DAVID MALCOLM
10 granted patents·2 pending applications·136 citations·filing 1995–2016
89Inventor score
Files withULTRATECH INC4CALIFORNIA INST OF TECHN1CROSS COLLIN WADE1HAWRYLUK ANDREW M1PHILIP CHEM SOLV INC1
Top patents by PatentIndex Score
12 records- 0192US6469788B2Coherent gradient sensing ellipsometerCALIFORNIA INST OF TECHN·Filed 2001·Granted Oct 22, 2002·60 cites·29 claims
- 0287US7433051B2Determination of lithography misalignment based on curvature and stress mapping data of substratesULTRATECH INC·Filed 2007·Granted Oct 7, 2008·16 cites·31 claims
- 0381US9935022B2Systems and methods of characterizing process-induced wafer shape for process control using CGS interferometryULTRATECH INC·Filed 2016·Granted Apr 3, 2018·3 cites·23 claims
- 0476USD390104SContainer for a potato or other vegetablePOTATO MARKETING CORP OF WESTERN AUSTRALIA·Filed 1996·Granted Feb 3, 1998·26 cites·1 claims
- 0567US8765493B2Methods of characterizing semiconductor light-emitting devices based on product wafer characteristicsHAWRYLUK ANDREW M·Filed 2012·Granted Jul 1, 2014·1 cites·22 claims
- 0664US8398849B2Application of visbreaker analysis tools to optimize performanceCROSS COLLIN WADE·Filed 2009·Granted Mar 19, 2013·3 cites·22 claims
- 0751US7369251B2Full-field optical measurements of surface properties of panels, substrates and wafersULTRATECH INC·Filed 2004·Granted May 6, 2008·7 cites·38 claims
- 0846US5942086AApplication of material to a substratePHILIP CHEM SOLV INC·Filed 1995·Granted Aug 24, 1999·13 cites·27 claims
- 0943US7517458B2Process obtaining landfill disposable wasted from hydrocarbon containing sludgeTREATCHEM LTD·Filed 2004·Granted Apr 14, 2009·1 cites·10 claims
- 1035US5685952ADeinking of paper using magnetic forcesFiled 1995·Granted Nov 11, 1997·6 cites·17 claims
- 1135US2017178980A1Full-wafer inspection methods having selectable pixel densityULTRATECH INC·Filed 2016·Application pending·0 cites
- 1230US2005007601A1Optical characterization of surfaces and platesFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →