Inventor · disambiguated record
David S. Perloff
Also filed as: PERLOFF DAVID S
10 granted patents·1 pending application·1,364 citations·filing 1985–2002
93Inventor score
Top patents by PatentIndex Score
11 records- 0195US4967381AProcess control interface system for managing measurement dataPROMETRIX CORP·Filed 1989·Granted Oct 30, 1990·207 cites·15 claims
- 0295US4873623AProcess control interface with simultaneously displayed three level dynamic menuPROMETRIX CORP·Filed 1987·Granted Oct 10, 1989·303 cites·6 claims
- 0393US5226118AData analysis system and method for industrial process control systemsPROMETRIX CORP·Filed 1991·Granted Jul 6, 1993·283 cites·28 claims
- 0492US4755746AApparatus and methods for semiconductor wafer testingPROMETRIX CORP·Filed 1985·Granted Jul 5, 1988·187 cites·21 claims
- 0591US4843538AMulti-level dynamic menu which suppresses display of items previously designated as non-selectablePROMETRIX CORP·Filed 1988·Granted Jun 27, 1989·142 cites·9 claims
- 0690US4679137AProcess control interface system for designer and operatorPROMETRIX CORP·Filed 1985·Granted Jul 7, 1987·83 cites·32 claims
- 0782US4703252AApparatus and methods for resistivity testingPROMETRIX CORP·Filed 1985·Granted Oct 27, 1987·42 cites·12 claims
- 0881US4805089AProcess control interface system for managing measurement dataPROMETRIX CORP·Filed 1986·Granted Feb 14, 1989·74 cites·12 claims
- 0975US4951190AMultilevel menu and hierarchy for selecting items and performing tasks thereon in a computer systemPROMETRIX CORP·Filed 1989·Granted Aug 21, 1990·35 cites·10 claims
- 1066US7449682B2System and method for depth profiling and characterization of thin filmsREVERA INC·Filed 2002·Granted Nov 11, 2008·8 cites·34 claims
- 1143US2003080291A1System and method for characterization of thin filmsPHYSICAL ELECTRONICS IND INC·Filed 2001·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when David S. Perloff files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →