Inventor · disambiguated record
David W. Price
Also filed as: PRICE DAVID · PRICE DAVID W · PRICE DAVID WILSON · PRICE II DAVID W
16 granted patents·2 pending applications·65 citations·filing 1981–2022
89Inventor score
Files withKLA CORP10KLA TENCOR CORP2PRICE II DAVID W2BAE SYSTEMS ORDNANCE SYSTEMS INC1LITVIN ROBERT L1
Top patents by PatentIndex Score
18 records- 0194US10761128B2Methods and systems for inline parts average testing and latent reliability defect detectionKLA TENCOR CORP·Filed 2017·Granted Sep 1, 2020·23 cites·20 claims
- 0293US11614480B2System and method for Z-PAT defect-guided statistical outlier detection of semiconductor reliability failuresKLA CORP·Filed 2021·Granted Mar 28, 2023·3 cites·29 claims
- 0390US11293970B2Advanced in-line part average testingKLA CORP·Filed 2020·Granted Apr 5, 2022·4 cites·31 claims
- 0476US11598055B2Mobile rubber applicator with wide-area ceramic blanket heaterPRICE II DAVID W·Filed 2020·Granted Mar 7, 2023·1 cites·9 claims
- 0576US11066792B2Asphalt reclaimer with top heating lidPRICE II DAVID W·Filed 2020·Granted Jul 20, 2021·1 cites·11 claims
- 0675US10867877B2Targeted recall of semiconductor devices based on manufacturing dataKLA TENCOR CORP·Filed 2018·Granted Dec 15, 2020·2 cites·29 claims
- 0766US6756605B1Molecular scale electronic devicesUNIV YALE·Filed 2000·Granted Jun 29, 2004·21 cites·16 claims
- 0856US11899065B2System and method to weight defects with co-located modeled faultsKLA CORP·Filed 2022·Granted Feb 13, 2024·0 cites·32 claims
- 0953US12422376B2Imaging reflectometry for inline screeningKLA CORP·Filed 2021·Granted Sep 23, 2025·0 cites·44 claims
- 1053US12332182B2System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test dataKLA CORP·Filed 2022·Granted Jun 17, 2025·0 cites·42 claims
- 1151US11798827B2Systems and methods for semiconductor adaptive testing using inline defect part average testingKLA CORP·Filed 2021·Granted Oct 24, 2023·0 cites·25 claims
- 1251US11624775B2Systems and methods for semiconductor defect-guided burn-in and system level testsKLA CORP·Filed 2021·Granted Apr 11, 2023·0 cites·25 claims
- 1350US11754625B2System and method for identifying latent reliability defects in semiconductor devicesKLA CORP·Filed 2021·Granted Sep 12, 2023·0 cites·27 claims
- 1449US11656274B2Systems and methods for evaluating the reliability of semiconductor die packagesKLA CORP·Filed 2021·Granted May 23, 2023·0 cites·35 claims
- 1544US11535574B2High energy reduced sensitivity tactical explosivesBAE SYSTEMS ORDNANCE SYSTEMS INC·Filed 2018·Granted Dec 27, 2022·0 cites·16 claims
- 1642US2022196723A1System and method for automatically identifying defect-based test coverage gaps in semiconductor devicesKLA CORP·Filed 2021·Application pending·0 cites
- 1742US2004238056A1Cooler drain having polypropylene inner drain and thermoplastic elastomer outer drainFiled 2003·Application pending·0 cites
- 1829US4449741AWaste plumbing installation and fittings thereforLITVIN ROBERT L·Filed 1981·Granted May 22, 1984·10 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →