Inventor · disambiguated record
David B. Scott
Also filed as: SCOTT DAVID · SCOTT DAVID B · SCOTT DAVID BARRY
57 granted patents·6 pending applications·1,669 citations·filing 1981–2024
99Inventor score
Files withTEXAS INSTRUMENTS INC49TAIWAN SEMICONDUCTOR MFG4TAIWAN SEMICONDUCTOR MFG CO LTD4DAVIES RODERICK D1HOU YUNG-CHIN1
Top patents by PatentIndex Score
63 records- 0198US7307471B2Adaptive voltage control and body bias for performance and energy optimizationTEXAS INSTRUMENTS INC·Filed 2005·Granted Dec 11, 2007·106 cites·26 claims
- 0297US8432071B2Method and apparatus for energy harvest from ambient sourcesHUANG MING-CHIEH·Filed 2010·Granted Apr 30, 2013·279 cites·18 claims
- 0397US4374700AMethod of manufacturing silicide contacts for CMOS devicesTEXAS INSTRUMENTS INC·Filed 1981·Granted Feb 22, 1983·173 cites·10 claims
- 0496US7639056B2Ultra low area overhead retention flip-flop for power-down applicationsTEXAS INSTRUMENTS INC·Filed 2005·Granted Dec 29, 2009·52 cites·13 claims
- 0595US7282905B2System and method for IDDQ measurement in system on a chip (SOC) designTEXAS INSTRUMENTS INC·Filed 2004·Granted Oct 16, 2007·77 cites·8 claims
- 0695US7236396B2Area efficient implementation of small blocks in an SRAM arrayTEXAS INSTRUMENTS INC·Filed 2005·Granted Jun 26, 2007·58 cites·30 claims
- 0794US5656524AMethod of forming a polysilicon resistor using an oxide, nitride stackTEXAS INSTRUMENTS INC·Filed 1995·Granted Aug 12, 1997·133 cites·6 claims
- 0892US8504972B2Standard cells having flexible layout architecture/boundariesHOU YUNG-CHIN·Filed 2010·Granted Aug 6, 2013·21 cites·19 claims
- 0991US10872190B2Method and system for latch-up preventionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 22, 2020·5 cites·20 claims
- 1091US7164291B2Integrated header switch with low-leakage PMOS and high-leakage NMOS transistorsTEXAS INSTRUMENTS INC·Filed 2004·Granted Jan 16, 2007·38 cites·19 claims
- 1190US5019888ACircuit to improve electrostatic discharge protectionTEXAS INSTRUMENTS INC·Filed 1987·Granted May 28, 1991·65 cites·16 claims
- 1289US5291444ACombination DRAM and SRAM memory arrayTEXAS INSTRUMENTS INC·Filed 1991·Granted Mar 1, 1994·74 cites·14 claims
- 1389US4984196AHigh performance bipolar differential sense amplifier in a BiCMOS SRAMTEXAS INSTRUMENTS INC·Filed 1988·Granted Jan 8, 1991·59 cites·11 claims
- 1485US4476482ASilicide contacts for CMOS devicesTEXAS INSTRUMENTS INC·Filed 1982·Granted Oct 9, 1984·40 cites·8 claims
- 1583US8362573B2Integrated circuits and manufacturing methods thereofTAIWAN SEMICONDUCTOR MFG·Filed 2010·Granted Jan 29, 2013·6 cites·20 claims
- 1683US7407850B2N+ poly on high-k dielectric for semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2005·Granted Aug 5, 2008·9 cites·16 claims
- 1782US2024386180A1Method and system for latch-up preventionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1880US12412019B2Method and system for latch-up preventionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 9, 2025·0 cites·20 claims
- 1979US6178136B1Semiconductor memory device having Y-select gate voltage that varies according to memory cell access operationTEXAS INSTRUMENTS INC·Filed 1999·Granted Jan 23, 2001·44 cites·20 claims
- 2077US7519925B2Integrated circuit with dynamically controlled voltage supplyTEXAS INSTRUMENTS INC·Filed 2005·Granted Apr 14, 2009·9 cites·21 claims
- 2176US6678202B2Reduced standby power memory array and methodTEXAS INSTRUMENTS INC·Filed 2001·Granted Jan 13, 2004·23 cites·27 claims
- 2276US6141259ADynamic random access memory having reduced array voltageTEXAS INSTRUMENTS INC·Filed 1999·Granted Oct 31, 2000·38 cites·34 claims
- 2376US5021851ANMOS source/drain doping with both P and AsTEXAS INSTRUMENTS INC·Filed 1989·Granted Jun 4, 1991·44 cites·11 claims
- 2473US4851360ANMOS source/drain doping with both P and AsTEXAS INSTRUMENTS INC·Filed 1988·Granted Jul 25, 1989·28 cites·8 claims
- 2571US11615227B2Method and system for latch-up preventionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Mar 28, 2023·0 cites·20 claims
- 2671US4754314ASplit-level CMOSTEXAS INSTRUMENTS INC·Filed 1987·Granted Jun 28, 1988·26 cites·6 claims
- 2770US7162652B2Integrated circuit dynamic parameter management in response to dynamic energy evaluationTEXAS INSTRUMENTS INC·Filed 2003·Granted Jan 9, 2007·15 cites·36 claims
- 2869US6989702B2Retention register with normal functionality independent of retention power supplyTEXAS INSTRUMENTS INC·Filed 2003·Granted Jan 24, 2006·13 cites·47 claims
- 2967US4420344ACMOS Source/drain implant process without compensation of polysilicon dopingTEXAS INSTRUMENTS INC·Filed 1981·Granted Dec 13, 1983·30 cites·7 claims
- 3066US5506874APhase detector and methodTEXAS INSTRUMENTS INC·Filed 1993·Granted Apr 9, 1996·27 cites·27 claims
- 3164US7376038B2Fast access memory architectureTEXAS INSTRUMENTS INC·Filed 2006·Granted May 20, 2008·5 cites·20 claims
- 3260US8411525B2Memory circuits having a diode-connected transistor with back-biased controlSWEI STEVEN·Filed 2010·Granted Apr 2, 2013·2 cites·20 claims
- 3360US6620692B2Method of forming a metal oxide semiconductor transistor with self-aligned channel implantTEXAS INSTRUMENTS INC·Filed 2002·Granted Sep 16, 2003·6 cites·7 claims
- 3460US4777147AForming a split-level CMOS deviceTEXAS INSTRUMENTS INC·Filed 1987·Granted Oct 11, 1988·17 cites·16 claims
- 3559US7216310B2Design method and system for optimum performance in integrated circuits that use power managementTEXAS INSTRUMENTS INC·Filed 2004·Granted May 8, 2007·6 cites·20 claims
- 3658US5227269AMethod for fabricating high density DRAM reticlesTEXAS INSTRUMENTS INC·Filed 1990·Granted Jul 13, 1993·14 cites·9 claims
- 3756US5070381AHigh voltage lateral transistorTEXAS INSTRUMENTS INC·Filed 1990·Granted Dec 3, 1991·17 cites·5 claims
- 3855US5102811AHigh voltage bipolar transistor in BiCMOSTEXAS INSTRUMENTS INC·Filed 1990·Granted Apr 7, 1992·17 cites·9 claims
- 3954US7091766B2Retention register for system-transparent state retentionTEXAS INSTRUMENTS INC·Filed 2003·Granted Aug 15, 2006·6 cites·28 claims
- 4052US7180208B2Switch structure for reduced voltage fluctuation in power domains and sub-domainsTEXAS INSTRUMENTS INC·Filed 2003·Granted Feb 20, 2007·7 cites·25 claims
- 4151US8122406B2Generating models for integrated circuits with sensitivity-based minimum change to existing modelsSHEU BING J·Filed 2008·Granted Feb 21, 2012·1 cites·20 claims
- 4251US6773972B2Memory cell with transistors having relatively high threshold voltages in response to selective gate dopingTEXAS INSTRUMENTS INC·Filed 2001·Granted Aug 10, 2004·7 cites·22 claims
- 4351US4406710AMask-saving technique for forming CMOS source/drain regionsDAVIES RODERICK D·Filed 1981·Granted Sep 27, 1983·19 cites·10 claims
- 4451US2008272442A1N+ poly on high-k dielectric for semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2008·Application pending·0 cites
- 4550US9385213B2Integrated circuits and manufacturing methods thereofTAIWAN SEMICONDUCTOR MFG·Filed 2012·Granted Jul 5, 2016·0 cites·10 claims
- 4650US5079441AIntegrated circuit having an internal reference circuit to supply internal logic circuits with a reduced voltageTEXAS INSTRUMENTS INC·Filed 1988·Granted Jan 7, 1992·12 cites·15 claims
- 4748US2011153055A1Wide-range quick tunable transistor modelTAIWAN SEMICONDUCTOR MFG·Filed 2009·Application pending·0 cites
- 4845US8804450B2Memory circuits having a diode-connected transistor with back-biased controlTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Aug 12, 2014·0 cites·20 claims
- 4945US6831337B2Transistor circuit with varying resistance lightly doped diffused regions for electrostatic discharge (“ESD”) protectionTEXAS INSTRUMENTS INC·Filed 2003·Granted Dec 14, 2004·2 cites·6 claims
- 5044US6730582B2Transistor circuit with varying resistance lightly doped diffused regions for electrostatic discharge (ESD) protectionTEXAS INSTRUMENTS INC·Filed 2001·Granted May 4, 2004·2 cites·6 claims
Showing the top 50 of 63 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →