Inventor · disambiguated record
Dennis G. Emge
Also filed as: EMGE DENNIS · EMGE DENNIS G
4 granted patents·829 citations·filing 1994–2015
81Inventor score
Top patents by PatentIndex Score
4 records- 0195US5578821AElectron beam inspection system and methodKLA INSTR CORP·Filed 1995·Granted Nov 26, 1996·421 cites·51 claims
- 0295US5502306AElectron beam inspection system and methodKLA INSTR CORP·Filed 1994·Granted Mar 26, 1996·400 cites·35 claims
- 0387US8995746B2Image synchronization of scanning wafer inspection systemKLA TENCOR CORP·Filed 2013·Granted Mar 31, 2015·7 cites·21 claims
- 0472US9208553B2Image synchronization of scanning wafer inspection systemKLA TENCOR CORP·Filed 2015·Granted Dec 8, 2015·1 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →